Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||A S. Bakulin; S M. Durbin; Terrence J. Jach; J Pedulla;|
|Title:||Fast Imaging of Hard X-Rays With a Laboratory Microscope|
|Published:||July 01, 2000|
|Abstract:||An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x-rays. It uses the Kirkpatrick-Baez multilayer mirror design to form an image that has a demonstrated resolution of 4 m at 8 keV (Cu Kα radiation). This microscope performs well with standard sealed-tube laboratory x-ray sources, producing digital images with 20-s exposure times for m Au grid (a thickness of two absorption lengths).|