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|Author(s):||Cedric J. Powell;|
|Title:||NIST Data Resources for X-Ray Photoelectron Spectroscopy|
|Published:||October 01, 2000|
|Abstract:||A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic-Electron-Scattering Cross-Section Database (SRD 64), and an Electron Inelastic-Mean-Free-Path Database (SRD 71). NIST also offers Standard Test Data for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet; these spectra are available over the internet.|
|Citation:||Surface and Interface Analysis|
|Pages:||pp. 703 - 704|
|Keywords:||databases,reference data,standard test data,surface analysis,x-ray photoelectron spectroscopy|
|Research Areas:||Databases, Standard Reference Data, Surfaces, Spectroscopy|