| Author(s): |
Cedric J. Powell; |
| Title: |
NIST Data Resources for X-Ray Photoelectron Spectroscopy |
| Published: |
October 01, 2000 |
| Abstract: |
A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic-Electron-Scattering Cross-Section Database (SRD 64), and an Electron Inelastic-Mean-Free-Path Database (SRD 71). NIST also offers Standard Test Data for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet; these spectra are available over the internet. |
| Citation: |
Surface and Interface Analysis |
| Volume: |
29 |
| Issue: |
10 |
| Pages: |
pp. 703 - 704 |
| Keywords: |
databases;reference data;standard test data;surface analysis;x-ray photoelectron spectroscopy |
| Research Areas: |
Databases, Standard Reference Data, Surfaces, Spectroscopy |
