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Publication Citation: NIST Data Resources for X-Ray Photoelectron Spectroscopy

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Author(s): Cedric J. Powell;
Title: NIST Data Resources for X-Ray Photoelectron Spectroscopy
Published: October 01, 2000
Abstract: A short description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for X-Ray Photoelectron Spectroscopy (XPS). NIST currently has three databases available: an XPS Database (SRD 20), an Elastic-Electron-Scattering Cross-Section Database (SRD 64), and an Electron Inelastic-Mean-Free-Path Database (SRD 71). NIST also offers Standard Test Data for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet; these spectra are available over the internet.
Citation: Surface and Interface Analysis
Volume: 29
Issue: 10
Pages: pp. 703 - 704
Keywords: databases;reference data;standard test data;surface analysis;x-ray photoelectron spectroscopy
Research Areas: Databases, Standard Reference Data, Surfaces, Spectroscopy