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|Author(s):||Howard H. Harary;|
|Title:||Proceedings of a NIST Internal Workshop on Non-Contact Thermometry|
|Published:||January 01, 2000|
|Abstract:||This report collects the executive summaries and visual of twenty-two presentations from an internal workshop on non-contract thermometry at NIST. The workshop took place on April 14, 2000, at NIST in Gaithersburg, Maryland, and was video-conferenced to NIST in Boulder, CO. The purpose of the workshop was to share information about non-contract thermometry (NCT) activities at NIST in order to:--Recognize and document the areas of application of NCT at NIST and identify the challenges, limiting technical requirements, and trends for those applications; and--Describe cutting-edge work on NCT technology at NIST, including new sensors, calibrations, modeling, and data interpretation.The outcomes sought from the workshop are to:--Identify opportunities for the sharing of ideas and technology among NIST NCT activities;--Promote collaboration between NCT technology developers and users;--Identify new opportunities for NIST to make critical contributions to industrial manufacturing and emerging technologies; and--Present evidence of the excellence and breadth of NCT activities at NIST as a tool to motivate industry participation in a second workshop focusing on industrial NCT needs--planned for this fall.|
|Citation:||NIST Interagency/Internal Report (NISTIR) - 6572|
|Keywords:||emissivity,fluorescence,infrared spectrograph,non-contact,radiation thermometry,semiconductors,spectral radiance temperature,temperature measurements,thermometry|
|Research Areas:||Metrology, Manufacturing|