NIST Authors in Bold
| Author(s): | S H. Southworth; L Young; E P. Kanter; Thomas W. LeBrun; |
|---|---|
| Title: | X-ray Scattering and Fluorescence From Atoms and Molecules |
| Published: | January 01, 2000 |
| Abstract: | Fundamental understanding of x-ray interactions with atoms and molecules provides a basis for applying x-ray methods to complex materials, such as structural determinations by x-ray diffraction and extended x-ray absorption fine structure. Compton scattering measurements of electron-momentum P distributions, and determinations of local chemical environments by x-ray interactions with atoms and molecules relevant to understanding elastic and inelastic scattering cross sections far from threshold and resonance and threshold phenomena in x-ray fluorescence. The ideas are discussed in the context of providing theoretical interpretations of experimental results and are topics of ongoing theoretical developments. We also discuss experimental methods of x-ray spectroscopy using solid-state and wavelength-dispersive spectrometers with excitation by tunable synchrotron radiation. The examples discussed are primarily from the authors' research. We did not attempt to provide a comprehensive review, but several recent review articles and research papers are referenced for further information. The ideas discussed are general and relevant to understanding fundamental studies and applications of x-ray scattering and fluorescence. |
| Citation: | Photoionization and Photodetachment (Advanced Series in Physical Chemistry, Vol. 10) by Cheuk-Yiu Ng (Editor) |
| Publisher: | World Scientific Publishing Co. Pte. Ltd., River Edge, NJ |
| Volume: | 10 |
| Keywords: | argon;Br2;C12;CF3C1;coincidence techniques;Compton scattering;helium;krypton;nondipole scattering;Rayleigh scattering neon;x-ray fluorescence spectroscopy;x-ray scattering;xenon |
| Research Areas: | Metrology, Manufacturing |