NIST Authors in Bold
| Author(s): | Gerald V. Blessing; D Xiang; Nelson N. Hsu; |
|---|---|
| Title: | Time and Polarization Resolved Ultrasonic Testing of Materials |
| Published: | January 01, 1996 |
| Abstract: | We have developed a transducer which allows the benefits of Line Focus Beam (LFB) acoustic microscopy to be realized over large areas, using a conventional pulser-receiver. Experimental evidence is presented to show that the transducer is correctly modeled in detail by Green?s function theory, and that all relevant wave speeds can also be predicted using a much simpler geometrical ray model. Data obtained by simply rotating the transducer a fixed distance above the specimen are presented using grey-scale plots which establish the ease with which anisotropy can be revealed. Finally, a grey-scale plot of rotational-scan data recast in terms of velocity is shown to demonstrate the simultaneous detection of both surface and pseudo-surface waves in the same crystallographic orientation of a silicon specimen. |
| Conference: | American Society for Nondestructive Testing |
| Proceedings: | Proceedings of the First US-Japan Symposium on Advances in NDT |
| Pages: | pp. 205 - 206 |
| Keywords: | Nondestructive evaluation;Ultrasonics |
| Research Areas: | Mechanical Metrology |