NIST Authors in Bold
| Author(s): | Matthew D. McMahon; Andrew J. Berglund; Peter T. Carmichael; Jabez J. McClelland; James A. Liddle; |
|---|---|
| Title: | 3D Particle Trajectories Observed by Orthogonal Tracking Microscopy |
| Published: | February 09, 2009 |
| Abstract: | We demonstrate high-resolution, high-speed 3D nanoparticle tracking using angled micromirrors. When angled micromirrors are introduced into the field of view of an optical microscope, reflected side-on views of a diffusing nanoparticle are projected alongside the usual direct image. The experimental design allows us to find the 3D particle trajectory using fast, centroid-based image processing, with no nonlinear computing operations. We have tracked polystyrene particles of 190 nm diameter with position measurement precision <20 nm in 3D with 3 ms frame duration (i.e., at an imaging rate >330 frames per second). Because the image processing requires only ≈1 ms per frame, this technique could enable real-time feedback-controlled nanoparticle assembly applications with nanometer precision. |
| Citation: | ACS Nano |
| Volume: | 3 |
| Pages: | pp. 609 - 614 |
| Keywords: | orthogonal tracking microscopy; particle tracking; three-dimensional microscopy; optical microscopy; digital video microscopy; multiple vantage point microscopy |
| Research Areas: | Optical microscopy |
| PDF version: | Click here to retrieve PDF version of paper (622KB) |