| Author(s): |
John Unguris; Daniel T. Pierce; Seok-Hwan Chung; |
| Title: |
SEMPA Imaging for Spintronics Applications |
| Published: |
January 01, 2007 |
| Abstract: |
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface. |
| Conference: |
Frontiers of Characterization and Metrology for Nanoelectronics 2007 |
| Location: |
Gaithersburg, Maryland |
| Dates: |
January 1, 2007 |
| Keywords: |
exchange coupling;nanomagnetism;spin polarization;spin reorientation;spin torque transfer;spintronics |
| Research Areas: |
Nanomagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (393KB) |
