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Publication Citation: SEMPA Imaging for Spintronics Applications

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Author(s): John Unguris; Daniel T. Pierce; Seok-Hwan Chung;
Title: SEMPA Imaging for Spintronics Applications
Published: January 01, 2007
Abstract: Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.
Conference: Frontiers of Characterization and Metrology for Nanoelectronics 2007
Location: Gaithersburg, Maryland
Dates: January 1, 2007
Keywords: exchange coupling;nanomagnetism;spin polarization;spin reorientation;spin torque transfer;spintronics
Research Areas: Nanomagnetics
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