| Author(s): |
M. Loehndorf; John M. Moreland; Pavel Kabos; |
| Title: |
Ferromagnetic Resonance Detection with a Torsion-mode Atomic-force Microscope |
| Published: |
February 01, 2000 |
| Abstract: |
We have developed a ferromagnetic resonance (FMR) instrument based on a torsion-mode atomic-force microscope (AFM). The instrument measures the torque on a magnetized thin film in a static out-of-plane field perpendicular to the film surface. The magnetic film is deposited outo an AFM microcantilever. FMR measurements are performed at a fixed microwave frequency of 9.15 GHz with a sweeping in-plane field. At the FMR condition, the change in the average in-plane magnetization of the film is at a maximum corresponding to a maximum change in the torque on the AFM cantilever. Our instrument is capable of measuring fluctuations of in-plane magnetization of 63.3 A/m of NiFe film samples with a total volume of 1.1x10-10 cm3. Given a signal-to-noise ratio of 40, we estimate a magnetic moment sensitivity of 1.7 x 10-16 A/m2. |
| Citation: |
Applied Physics Letters |
| Volume: |
76 |
| Issue: |
9 |
| Pages: |
pp. 1176 - 1178 |
| Keywords: |
atomic force microscope;ferromagnetic resonance (FMR);instrument measures the torque;magnetization fluctuations microcantilev; |
| Research Areas: |
Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (97KB) |
