Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Title:||Internal Resistance of Voltage Source Using the FDTD Technique|
|Published:||November 02, 2009|
|Abstract:||The introduction of the internal resistance of a voltage source is a very effective method for analyzing the electromagnetic characteristics of antennas and microstrip devices using the FDTD technique. However, some trial and error could be accompanied for a proper resistance values to obtain a stable result. This letter proposes the method to reflect a proper internal resistance of source voltage in an FDTD code. The key of this method is to choose a resistance value so that the voltage drop due to an internal resistance is less than the amplitude of a voltage source. The reductions of total computation time steps are shown for various antenna types.|
|Citation:||IEEE Microwave and Wireless Components Letters|
|Pages:||pp. 1194 - 1197|
|Keywords:||Source resistance,FDTD technique,voltage drop,reduction of time steps|
|PDF version:||Click here to retrieve PDF version of paper (705KB)|