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NIST Authors in Bold
|Author(s):||John H. Lehman; Tom Campbell; Anne Dillon; Roop Mahajan;|
|Title:||Round-robin testing of carbon nanotubes using Novel and traditional nanometrology tools|
|Published:||August 26, 2007|
|Abstract:||Quantitative, systematic and reproducible metrology of carbon nanotubes is paramount to the fundamental understanding of these promising nanomaterials. Moreover, development of novel techniques which extend the current arsenal of nanotools is also desirable within the nanometrology community. Toward the end of contributing to improved rigor in carbon nanotube metrology, we present in this article a round-robin series of measurements on select sample sets of carbon nanotubes using techniques currently under development at the National Institute of Standards & Technology, as well as more ?traditional? nanometrology tools. We trace the comparison and validation of these novel techniques through the round-robin testing on identical samples and show that the new techniques deserve recognition as complementary nanotools for more commonly applied instruments. The round-robin testing includes the following subsets: (i) carbon nanotubes produced in specific ranges (?10%) of purity, and (ii) carbon nanotubes with specific purity ranges (?10%) and pre-screened ranges (?10%) of electronic type (i.e., metallic:semiconducting ratio). Such testing will ultimately contribute to the standards and protocols now under development for carbon nanotube metrology around the world.|
|Conference:||The Annual Meeting of the IEEE Lasers and Electro-Optics Society|
|Location:||San Diego, CA|
|Dates:||August 26-30, 2007|