Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Effect of Fatigue under Transverse Compressive Stress on Slitted Y-Ba-Cu-O Coated Conductors

NIST Authors in Bold

Author(s): Najib Cheggour; John (Jack) W. Ekin; C. L. H. Thieme; Y Y. Xie;
Title: Effect of Fatigue under Transverse Compressive Stress on Slitted Y-Ba-Cu-O Coated Conductors
Published: June 01, 2007
Abstract: The slitting of wide Y-Ba-Cu-O coated-conductor tapes to a width desirable for applications allows a considerable reduction in conductor manufacturing cost. Localized damage induced at the slit edges may be tolerated provided that mechanical cracks formed in the ceramic layers do not propagate deeper inside the conductor due to mechanical forces and thermal cycling to which the strand will be subjected to in actual applications. In order to evaluate the effect of slitting, we used fatigue cycling under transverse compressive stress. These tests simulate conditions in applications such as rotating machinery and industrial magnets. Conductors measured had a rolling-assisted biaxially textured Ni-W substrate (RABiTS), or a Hastalloy-C substrate with an ion-beam assisted deposition (IBAD) buffer template. Samples were fabricated with or without a Cu protection layer, added either before or after slitting. For all these geometries, the critical current exhibited no significant degradation during fatigue testing up to 150 MPa transverse compressive stress and 20,000 cycles. Nevertheless, the results do not imply that slitting is not deleterious to the conductor performance under all experimental conditions.
Citation: IEEE Transactions on Applied Superconductivity
Volume: 17
Issue: 2
Pages: pp. 3063 - 3066
Keywords: Coated conductors,crack propagation,critical current density,fatigue cycling,IBAD,RABiTS,slitting,stress,transverse compression,Y-Ba-Cu-O
Research Areas: Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (146KB)