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Publication Citation: Nanomechanical Mapping with Resonance Tracking Scanned Probe Microscope

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Author(s): Anthony B. Kos; Donna C. Hurley;
Title: Nanomechanical Mapping with Resonance Tracking Scanned Probe Microscope
Published: November 23, 2007
Abstract: We present a new digital-signal-processor-based resonance tracking system for scanned probe microscopy (SPM) imaging. The system was developed to enable quantitative imaging of mechanical properties with nanoscale spatial resolution at practical data acquisition rates. It consists of a 32-bit floating-point digital signal processor connected to a high-resolution audio coder/decoder subsystem, an rms-to-dc converter, and a voltage-controlled oscillator. These components are used in conjunction with a commercial atomic force microscope to create a versatile platform for SPM mechanical mapping. Images of a glass-fiber/polymer matrix composite sample are presented to demonstrate system performance.
Citation: Review of Scientific Instruments
Volume: 19
Pages: pp. 1 - 9
Keywords: atomic force acoustic microscopy;atomic force microscope;contact-resonance spectroscopy;digital signal processor;elastic modulus;rms-to-dc converter;scanned probe microscopy
Research Areas: Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (638KB)