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|Author(s):||Thomas M. Wallis; John M. Moreland; Pavel Kabos;|
|Title:||Einstein-de Haas effect in a NiFe film deposited on a microcantilever|
|Published:||September 18, 2006|
|Abstract:||A new methods is presented for determining the magetomechanical ratio, g', in a thin ferromagnetic film deposited on a microcantilever via measurement of the Einstein-de Haas effect. An alternating magnetic field applied in the plane of the cantilever and perpendicular to its length induces bending oscillations of the cantilever that are measured with a fiber optic interferometer. Measurement of g' provides new, complementary information about the g-factor in ferromagnetic films that is not directly available from other characterization techniques. For a 50 nm Ni80Fe20 film deposited on a silicon nitride cantilever, g' is measured to be 1.89 + 0.20.|
|Citation:||Applied Physics Letters|
|Pages:||pp. 122501-1 - 122501-3|
|Keywords:||Gyromagnetic effects, magnetic thin films, microcantilevers, magnetization dynamics, permalloy, gyromagnetic ratio, magnetic resonance|
|PDF version:||Click here to retrieve PDF version of paper (250KB)|