| Author(s): |
Thomas M. Wallis; John M. Moreland; Pavel Kabos; |
| Title: |
Einstein-de Haas effect in a NiFe film deposited on a microcantilever |
| Published: |
September 18, 2006 |
| Abstract: |
A new methods is presented for determining the magetomechanical ratio, g', in a thin ferromagnetic film deposited on a microcantilever via measurement of the Einstein-de Haas effect. An alternating magnetic field applied in the plane of the cantilever and perpendicular to its length induces bending oscillations of the cantilever that are measured with a fiber optic interferometer. Measurement of g' provides new, complementary information about the g-factor in ferromagnetic films that is not directly available from other characterization techniques. For a 50 nm Ni80Fe20 film deposited on a silicon nitride cantilever, g' is measured to be 1.89 + 0.20. |
| Citation: |
Applied Physics Letters |
| Volume: |
89 |
| Pages: |
pp. 122501-1 - 122501-3 |
| Keywords: |
Gyromagnetic effects, magnetic thin films, microcantilevers, magnetization dynamics, permalloy, gyromagnetic ratio, magnetic resonance |
| Research Areas: |
Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (244KB) |
