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Manufacturing Programs & Projects

(showing 1 - 15 of 95)
Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 10/01/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

SI Length and Traceability
Last Updated Date: 10/01/2014

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/30/2014

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 09/30/2014

The US manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to more rapidly inspect high … more

Dimensional Measurement Services
Last Updated Date: 09/30/2014

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/30/2014

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/30/2014

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Smart Manufacturing Systems Design and Analysis
Last Updated Date: 08/27/2014

Smart Manufacturing has the potential to fundamentally change how products are designed, manufactured, supplied, used, remanufactured and … more

Real-Time Data Analytics for Smart Manufacturing Systems Project
Last Updated Date: 08/27/2014

The assessment of diagnostics and prognostics for real-time improvement of dynamic production system efficiency requires data analytics solutions … more

Performance Assurance for Smart Manufacturing Systems
Last Updated Date: 08/27/2014

Assurance of the performance of Smart Manufacturing Systems (SMS) starts with establishing a baseline for measuring the performance of a system. … more

Smart Manufacturing Architecture and Solution Stack Project
Last Updated Date: 08/27/2014

The next generation of smart manufacturing systems will be developed by composing advanced manufacturing components and information technology … more

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