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Strategies for Testing Embedded Software


This is a competence project to investigate new testing strategies for embedded software.

The potential customers are US electronic instrument manufactures including Fluke, HP and Intel.


The objective of this project is to develop efficient new testing strategies for devices following a model outside the usual non-software-embedded framework using the concept of Expectation Maximization (EM). The EM approach is attractive because it would provide an efficient method for extending HELP, or other testing tools, to the more complex device model.

Lead Organizational Unit:



The following NIST staff are involved in this project:

  • Hung-kung Liu (Division 898, ITL),  
  • Will Guthrie (Division 898, ITL),  
  • Gene Wang (Cornell University on contract to Division 898, ITL)  
  • Gerard Stenbakken (Division 811, EEEL),  
  • Mike Souders (Division 811, EEEL),



Hung-kung Liu
100 Bureau Drive, M/S 8980
Gaithersburg, MD 20899-8980