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Electronics & Telecommunications News

(showing 106 - 120 of 303)
1000 Calibration Reports . . . And Counting
Release Date: 11/21/2012

Igor Vayshenker works with the tunable laser system. The U.S. Internet – and indeed any communication system that sends information by fiber-optic … more

Enriched Silicon: Going for Four Nines
Release Date: 11/20/2012

The outside of the deposition chamber with researcher Kevin Dwyer looking on, and a close-up of the inside showing the silicon target (glowing … more

Coming Soon: Tabletop Molecular Movies
Release Date: 11/05/2012

Close-up of water-jet target (vertical line, ~ 0.2 mm wide) used to produce picosecond x-ray pulses. Credit: Jens Uhlig One of the most urgently … more

New Boulder Clean Room Open for Business
Release Date: 11/02/2012

Clean room manager John Nibarger examines a wafer carrier on a new load-locked deposition tool for sputtering noble-metal materials. After months … more

The First Controllable Atom SQUID
Release Date: 11/02/2012

Researcher Kevin Wright checks part of the experimental apparatus. Scientists have created the first controllable atomic circuit that functions … more

NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics
Release Date: 10/16/2012

The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a … more

NIST Selects Winner of Secure Hash Algorithm (SHA-3) Competition
Release Date: 10/02/2012

The National Institute of Standards and Technology (NIST) today announced the winner of its five-year competition to select a new cryptographic … more

Near-Field Scanning Microwave Microscope: Big at the Nanoscale
Release Date: 09/28/2012

The larger of the two alternating images above shows the topography of a nanowire bundle. The smaller image is the same bundle, but without the … more

NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more

September Workshop to Explore the Measurement Needs of the Flexible Electronics Industry
Release Date: 09/05/2012

The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on “Flexible Printed … more

CNST Researchers Demonstrate Low-Noise, Chip-Based Optical Wavelength Converter
Release Date: 09/05/2012

Scanning electron micrograph of the cross-section of a silicon nitride waveguide designed for the low-noise frequency conversion with a simulation … more

PML on Mars: Far-out Thermal Calibration
Release Date: 08/29/2012

PML physicist Michal Chojnacky (right) demonstrates the method used to calibrate platinum resistance thermometers. At left is sensor designer … more

Simulating the Sun for Photovoltaic Research
Release Date: 08/29/2012

Collimated output of the solar simulator illuminates a small solar cell. Electrical probes are used to measure cell efficiency. PML researchers … more

Disseminating the Kilogram, No Strings Attached
Release Date: 08/24/2012

Patrick Abbot inspects the upper (vacuum) section of the apparatus. The impending redefinition of the kilogram presents a weighty dilemma. Methods … more

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