Electronics & Telecommunications News | |
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NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory
Release Date: 05/20/2009 Pacemakers, like the implanted one shown in this image, are among the low-power devices that could be affected by new NIST findings about … more
New Nanotube Coating Enables Novel Laser Power Meter
Release Date: 05/05/2009 The U.S. military can now calibrate high-power laser systems, such as those intended to defuse unexploded mines, more quickly and easily thanks to … more
NIST Super-Sensors to Measure ‘Signature’ of Inflationary Universe
Release Date: 05/05/2009 What happened in the first trillionth of a trillionth of a trillionth of a second after the Big Bang? Super-sensitive microwave detectors, built … more
Conference Offers Insight Into Exploration of Nano-sized Electronics
Release Date: 04/21/2009 New methods for exploring the behavior of the high-performance electronics materials and devices that will shape the future of the electronics … more
Vibrationally Robust Frequency Comb
Release Date: 04/01/2009 Optical frequency combs have been vigorously developed over the past seven years at NIST and elsewhere. They provide a uniquely broadband and … more
New Program Evaluates Labs for Emergency Communications Tests
Release Date: 03/24/2009 To help ensure that first responders, public safety officers and military personnel can always talk with each other no matter what communications … more
Random Antenna Arrays Boost Emergency Communications
Release Date: 02/24/2009 First responders could boost their radio communications quickly at a disaster site by setting out just four extra transmitters in a random … more
Conference to Focus on Anti-Counterfeiting, Consumer Protection
Release Date: 02/10/2009 Representatives from business and government agencies concerned with intellectual property rights, particularly those concerning electronic … more
Cracking a Tough Nut for the Semiconductor Industry
Release Date: 12/23/2008 Researchers at the National Institute of Standards and Technology (NIST) have developed a method to measure the toughness—the resistance to … more
Electromagnetic Phantom Exorcises Specters of Metal Detector Tests
Release Date: 12/23/2008 Guest researcher John Jendzurski prepares the NIST electromagnetic phantom for passage through the walk-through metal detector behind it. The … more
Photoluminescence from GaN Nanowires
Release Date: 12/01/2008 Gallium nitride (GaN)-based semiconductors have successfully been incorporated into commercial light emitting diodes and commercial laser diodes … more
Neutron Researchers Discover Widely Sought Property in Magnetic Semiconductor
Release Date: 11/25/2008 Researchers working at the National Institute of Standards and Technology (NIST) have demonstrated for the first time the existence of a key … more
Bright Idea Illuminates LED Standards
Release Date: 11/25/2008 The lack of common measurement methods among light-emitting diode (LED) and lighting manufacturers has affected the commercialization of … more
NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
Release Date: 11/25/2008 Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of … more
Cold Atoms Could Replace Hot Gallium in Focused Ion Beams
Release Date: 11/12/2008 Scientists at the National Institute of Standards and Technology (NIST) have developed a radical new method of focusing a stream of ions into a … more |
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