Frontiers of In Situ Transmission Electron Microscopy

The significance and versatility of in situ transmission electron microscopy (TEM) has increased dramatically during the last 10 to 15 years. In situ TEM refers to a broad class of techniques in which the dynamic response of a material to an externally applied stimulus is observed as it happens inside the microscope. Stringent processing requirements necessitated by nanotechnology have stimulated advances in all aspects of TEM instrumentation, including application of external stimuli, high-resolution spatial and temporal imaging, and data capture. Unfortunately, nearly all of these efforts have been made independently of the other, limiting their effectiveness for in situ TEM. The purpose of this workshop is to discuss the current status of these independent developments with the intent of understanding how combinations of these advances can be used to tackle key scientific issues in nanoscience and nanotechnology.

In this two day workshop, invited presentations will cover the recent advances and current status of the various aspects of instrumentation as well as delineate future needs. Discussion sessions will focus on methods to combine imaging and spectroscopy with high spatial and temporal resolution on a single platform. The outcomes of the workshop will be published in an archived journal and will also be available online at this website.

Tentative List of Invited Speakers:

Peter Crozier – Arizona State University

Daan Hein – Hummingbird

Benjamin Jacobs – Protochips, Inc.

Jeorg Jincheck – FEI, Co.

Thomas LaGrange – Lawrence Livermore National Laboratory

Andrew Minor –University of California, Berkeley

Ming Pan – Gatan, Inc.

Zhewei Shan – Xi’An University, China

Seiji Takeda – Osaka University, Japan

Jakob Wagner – Technical University of Denmark

Xiao Feng Zhang – Hitachi High Technologies America, Inc.

Yimei Zhu – Brookhaven National Laboratory