Summary:There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission electron microscopies. In contrast, the typical tools for analyzing chemical composition yield information at a larger length scale, often missing critically important nanoscale information. For example, the most widely used infrared technique, Fourier transform infrared spectroscopy, generates chemical data with micrometer spatial resolution. To address this gap, we are currently developing a multifunctional instrument capable of simultaneously providing correlated topological, chemical (via infrared spectroscopy), thermal, and mechanical property maps with a spatial resolution below the diffraction limit of infrared radiation. Description:The size dependent properties of nanomaterials give them functionality not found in their macroscopic counterparts. Determining the relationship between the structural, physical and chemical properties of nanomaterials is important for technological applications including electronics, photovoltaics, catalysis, biology and therapeutics. While Infrared (IR) spectroscopy provides rich chemical and structural information, the wavelengths used to excite molecular vibrations, typically in the 3 - 15 μm range, are far larger than the characteristic dimensions of nanomaterials or cellular sub-components. Due to these longer wavelengths, IR imaging beyond the diffraction limit at the length scales typical of nanomaterials is more challenging than with visible light. |
Lead Organizational Unit:cnstFacilities/Tools Used:Contact
Andrea Centrone, Phone 301-975-8225 |