Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects | |
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Fundamentals of Deformation
Last Updated Date: 10/05/2012 This project provides new measurement methods, property data and simulations for areas critical to US manufacturing, describing the mechanisms … more
Dimensional Metrology for Nanofabrication
Last Updated Date: 10/05/2012 Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more
Synchrotron Beamline Operations
Last Updated Date: 10/04/2012 Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more
Measurement and Prediction of Local Structure
Last Updated Date: 10/04/2012 Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials … more
Synchrotron X-ray Measurements
Last Updated Date: 10/04/2012 Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more
Synchrotron X-ray Measurement Method Development
Last Updated Date: 10/04/2012 Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more
Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles
Last Updated Date: 10/02/2012 Atmospheric particles with long atmospheric lifetimes affect Earth's radiative balance. These particles typically consist of multiple chemical … more
Superresolving Optical Microscopy
Last Updated Date: 10/02/2012 Light microscopy is a widely used analytical tool because it provides non-destructive, real-time, three-dimensional imaging with chemical and … more
Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Last Updated Date: 10/02/2012 Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with … more
Trophic Transfer of Nanoparticles in a Simplified Invertebrate Food Web
Last Updated Date: 10/02/2012 We demonstrated that carboxylated and biotinylated quantum dots (QDs) can be transferred to higher trophic organisms (rotifers) through dietary … more
Mitigation of Systematic Errors in EFTEM Spectral Imaging via Median Filtering
Last Updated Date: 10/02/2012 A method has been developed for the removal from CCD images of point blemishes (PBs) ubiquitous in the acquisition of energy-filtered transmission … more
Evaluation of the Extent of Electron Scattering in a Low Vacuum Scanning Electron Microscope
Last Updated Date: 10/02/2012 Low vacuum scanning electron microscopes utilize gas molecules in the specimen chamber to neutralize the specimen charging from the impinging … more
DTSA-II Reinvention of a Classic
Last Updated Date: 10/02/2012 The original NBS/NIH DTSA (Desktop Spectrum Analyzer) software was widely used in the x-ray microanalysis research community. The combination of … more
Atomic Scale Imaging of Nanoscale Structures with Elemental Sensitivity in the NIST Titan 80-300
Last Updated Date: 10/02/2012 The characterization of CdSe/ZnS quantum dot structures has been carried out with compositionally sensitive imaging techniques utilizing the … more
Analysis of Copper Incorporation Into Zinc Oxide Nanowires
Last Updated Date: 10/02/2012 ZnO nanowires (NWs) are grown on bulk copper by chemical vapor deposition. Photoluminescence (PL) microscopy revealed band gap emission at 380 nm … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |