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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Nanoelectronic Device Metrology

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

Atom-Based Dimensional Metrology

To fabricate and measure solid state implementations of manufacturable atomically precise devices. Build the infrastructure to fabricate prototype … more

Traceable Scanning Probe Nano-Characterization

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Forensic Topography and Surface Metrology

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Quantum Conductance

Graphene, discovered in 2004, has truly extraordinary electronic properties that enable new approaches in many areas where conventional materials … more

RF Nano-electronics

The RF Nanoelectronics Project focuses on research and development of quantitative high-frequency metrology of RF nanomaterial, nanoelectronic and … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman