NIST Home > Characterization, Nanometrology, and Nanoscale Measurements Portal 

Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Magnetodynamics and Spin Electronics

The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more

Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Traceable Scanning Probe Nano-Characterization

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Three-Dimensional Nanometer Metrology

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

Atom Manipulation with the Scanning Tunneling Microscope

At the heart of nanotechnology is the need to create nanostructures, which are material structures whose dimensions are in the nanometer scale. … more

Measuring Topological Insulator Surface State Properties

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

*
Bookmark and Share

contact_18_1 

General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman