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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Whole Cell Tomography

Our goal is to develop novel correlative microscopy approaches for locating and characterizing engineered metal nanoparticles within complex … more

Novel Sources for Focused-ion Beams

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. In the CNST, researchers are … more

Measuring the Magneto-Electronic Properties of Graphene on the Nanometer Scale

The electrons in graphene are confined to the two-dimensional atomic layer of carbon atoms that make up the material . Since graphene was first … more

Strain Mapping and Simulation

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Nanoscale Strength Measurements and Standards

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman