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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Quantum Conductance

Graphene, discovered in 2004, has truly extraordinary electronic properties that enable new approaches in many areas where conventional materials … more

RF Nano-electronics

The RF Nanoelectronics Project focuses on research and development of quantitative high-frequency metrology of RF nanomaterial, nanoelectronic and … more

Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Forensic Topography and Surface Metrology

We seek to build the scientific infrastructure for objective forensic firearm and toolmark identification by developing rigorous procedures to … more

Probing Graphene Electronic Devices with Atomic Scale Measurements

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Whole Cell Tomography

Our goal is to develop novel correlative microscopy approaches for locating and characterizing engineered metal nanoparticles within complex … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman