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NIST Home > Characterization, Nanometrology, and Nanoscale Measurements Portal 

Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Probing Graphene Electronic Devices with Atomic Scale Measurements

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Measuring Topological Insulator Surface State Properties

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

Designing Advanced Scanning Probe Microscopy Instruments

A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more

Atom Manipulation with the Scanning Tunneling Microscope

At the heart of nanotechnology is the need to create nanostructures, which are material structures whose dimensions are in the nanometer scale. … more

Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Tracking Nanoparticles as Optical Indicators of Device Dynamics

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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