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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Tracking Nanoparticles as Optical Indicators of Device Dynamics

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

Quantum Voltage System Development and Dissemination

This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more

Measuring Topological Insulator Surface State Properties

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

Atom Manipulation with the Scanning Tunneling Microscope

At the heart of nanotechnology is the need to create nanostructures, which are material structures whose dimensions are in the nanometer scale. … more

Dimensional Metrology for Nanofabrication

Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more

Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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General Information:

301-975-NIST (6478) Telephone Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman