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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Traceable Scanning Probe Nano-Characterization

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Analytical Transmission Scanning Electron Microscopy

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Probing Graphene Electronic Devices with Atomic Scale Measurements

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Synchrotron X-ray Measurements

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Synchrotron X-ray Measurement Method Development

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Synchrotron Beamline Operations

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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General Information:

301-975-NIST (6478) Telephone
inquiries@nist.gov Email

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Technical Contact:
Lloyd Whitman