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Characterization, Nanometrology, and Nanoscale Measurements Portal

Programs and Projects
Nanoelectronic Device Metrology

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Atom-Based Dimensional Metrology

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

Traceable Scanning Probe Nano-Characterization

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Analytical Transmission Scanning Electron Microscopy

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Probing Graphene Electronic Devices with Atomic Scale Measurements

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Software
Electron holography

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE … more

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