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Materials Science Ceramics Portal

Programs and Projects
Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Synchrotron X-ray Measurements

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Synchrotron X-ray Measurement Method Development

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Synchrotron Beamline Operations

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Crystallographic Databases

Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured … more

In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM

Observing and measuring the dynamic changes that take place at the nanometer scale during the synthesis and operation of active nanostructures is … more

Software
RMCProfile Utility Programs

NOTICE: Some anti-virus programs have incorrectly reported that downloadable software previously available from this Web page contains malware. … more

GPPois: Gaussian Processes for Poisson-noised data

 gppois is a Bayesian tool for learning about a smooth function based on noisy measurements of its values. Users train a model of the true … more

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Contact

General Information:
301-975-NIST (6478)
inquiries@nist.gov

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