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NIST Electron Elastic-Scattering Cross-Section Database: Version 4.0 is available at: https://srdata.nist.gov/srd64/
Version 3.2 of this databaseprovides values of differential elastic-scattering cross sections, totalelastic-scattering cross sections, phase shifts, and transport cross sectionsfor elements with atomic numbers from 1 to 96 and for electron energies between50 eV and 300 keV (in steps of 1 eV). The cross sections in the database were provided by Prof. F. Salvatusing relativistic theory.Knowledge ofelastic-scattering effects is important for the development of theoreticalmodels for quantitative analysis by AES, XPS, electron microprobe analysis, andanalytical electron microscopy. The software package is designed to facilitatesimulations of electron transport for these and similar applications in whichelectron energies from 50 eV to 300 keV are utilized. An analysis of availableelastic-scattering cross-section data has been published by A. Jablonski, F.Salvat, and C. J. Powell J. Phys. Chem. Ref. Data 33, 409 (2004)].
Knowledge of elastic-scattering effects is important for the development of theoretical models for quantitative analysis by Auger-electron spectroscopy, x-ray photoelectron spectroscopy, electron microprobe analysis, and analytical electron microscopy. The software package is designed to facilitate simulations of electron transport for these and similar applications in which electron energies from 50 eV to 300 keV are utilized.
Hardware Requirements: PC with Windows 95, 98, NT, 2000, ME, XP, Vista or 7; CD-ROM drive; Hard disk space of at least 52 MB.
Please click here to view the PDF version of the Users' Guide.
Cedric Powell CSTL - Surface and Microanalysis Science Division (837)
National Institute of Standards and Technology
100 Bureau Drive, Stop 8370
Gaithersburg, MD 20899-8370 Phone: (301) 975-2534 FAX: (301) 216-1134 email: cedric.powell [at] nist.gov
Keywords: Auger electron spectroscopy; cross-section; elastic scattering; electron scattering; electron spectroscopy; electron transport; x-ray photoelectron spectroscopy; x-ray spectroscopy, electron-probe microanalysis, analytical electron microscopy, and surface analysis.