Gillaspy, J.
(2000),
Trapping Highly Charged Ions: Fundamentals and Applications, Nova Publisher, Hauppauge, NY
(Accessed April 18, 2024)
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Trapping Highly Charged Ions: Fundamentals and Applications
Published
Author(s)
Abstract
Fundamentals and applications for trapping highly charged ions.Citation
Trapping Highly Charged Ions: Fundamentals and Applications
Publisher Info
Nova Publisher, Hauppauge, NY
Pub Type
Books
Keywords
atoms, EBIT, electron beam ion trap, highly charged atoms
Citation
Created April 1, 2000, Updated February 19, 2017