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A Transmission X-Ray Microscope Based on Secondary-Electron Imaging,

Published

Author(s)

R N. Watts, S D. Liang, Zachary H. Levine, Thomas B. Lucatorto, F Polack, M R. Scheinfein
Citation
Review of Scientific Instruments
Volume
68

Citation

Watts, R. , Liang, S. , Levine, Z. , Lucatorto, T. , Polack, F. and Scheinfein, M. (1997), A Transmission X-Ray Microscope Based on Secondary-Electron Imaging,, Review of Scientific Instruments (Accessed March 28, 2024)
Created January 1, 1997, Updated February 17, 2017