The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and maintain the calibration of laboratory instrumentation.
Proceedings Title: Proceedings of Microscopy Society of America, John Friel, Editor
Conference Dates: January 1, 1994
Conference Location: Unknown, USA
Conference Title: Microscopy Society of America
Pub Type: Conferences