Kim, S.
, Sehgal, A.
, Karim, A.
and Fasolka, M.
(2003),
Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research, Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853897
(Accessed April 23, 2024)
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Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research
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Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research
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Others
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Keywords
Combinatorial and THE Methods, Informatics, Microscopy, Thin Films, combinatorial methods, film thickness, gradient libraries, high-throughput materials science, surface energy gradient, temperature gradient, thin films
Citation
Created January 1, 2003, Updated February 17, 2017