January 3, 2022
Author(s)
Falk Niefind, Henry Bell, Thuc Mai, Angela R. Hight Walker, Randolph Elmquist, Sujitra Pookpanratana
A photoemission electron microscope (PEEM) was recently commissioned at the NIST. To benchmark its capabilities, epitaxial graphene on 4H-SiC (0001) was imaged and analyzed in the PEEM and compared to other complementary imaging techniques. We determine