U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by:

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 51 - 60 of 60

Measuring residual resistivity ratio of high-purity Nb

July 27, 2004
Author(s)
Loren F. Goodrich, Theodore C. Stauffer, Jolene Splett, Dominic F. Vecchia
We compared methods of measuring the residual resistivity ratio (RRR) of high-purity Nb using transport current. Our experimental study is intended to answer some fundamental questions about the best measurement for RRR and the biases that may exist among

Modeling Warm-Up Drift in Commercial Harmonic Phase Standards

July 2, 2004
Author(s)
Jeffrey Jargon, Jolene Splett, Dominic F. Vecchia, Donald C. DeGroot
We develop an empirical model for the warm-up drift of harmonic phase standards that are used to calibrate the phase distortion of nonlinear vector nrtworks analyzers. This model will enable us to estimate the time at which the standards reach stability.

Estimation of Q-factors and Resonant Factors

March 1, 2003
Author(s)
Kevin Coakley, Jolene Splett, Michael D. Janezic, Raian K. Kaiser
We estimate the quality factor Q and resonant frequency f 0 of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering parameter

Estimation of Q-Factors and Resonant Frequencies

March 1, 2003
Author(s)
Kevin J. Coakley, Jolene D. Splett, Michael D. Janezic, R F. Kaiser
We estimate the quality factor Q and resonant frequency f o of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering parameter

Accuracy of AlGaAs Growth Rates and Composition Determination Using RHEED Oscillations

January 1, 2003
Author(s)
Todd E. Harvey, Kristine A. Bertness, Robert K. Hickernell, C. M. Wang, Jolene Splett
We investigate the sources of uncertainty in the measurement of the reflection high-energy electron diffraction (RHEED) intensity oscillations during growth of AlAs, GaAs, and AlGaAs on GaAs substrates, and the resulting effects on predicted growth rates

Accuracy of AlGaAs Rates and Composition Determination Using RHEED Oscillations

September 1, 2002
Author(s)
Todd E. Harvey, Kristine A. Bertness, Chih-Ming Wang, Jolene Splett
Reflection high-energy electron diffraction (RHEED) oscillations are widely used in molecular beam epitaxy (MBE) as a technique to calibrate material growth rates. The growth rates are used to predict the composition of the following growth run. For many