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Search Publications by: Joseph A. Dura (Fed)

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Displaying 26 - 50 of 59

Unraveling the Complex Hydration Behavior of Ionomers Under Thin Film Confinement

January 16, 2018
Author(s)
Shudipto K. Dishari, Christopher A. Rumble, Mark Maroncelli, Joseph Dura, Michael A. Hickner
Ionomers in thin films behave differently from bulk membranes and their behavior is not well understood. Here, thin films (25-250 nm) of sulfonated Radel (S-Radel) were investigated to understand thickness and hydration effects on the density and

Perovskite Nickelates as Electric-Field Sensors in Salt Water

January 4, 2018
Author(s)
Zhen Zhang, Derek Schwanz, Badri Narayanan, Michele Kotiuga, Joseph Dura, Mathew Cherukara, Hua Zhou, John W. Freeland, Jiarui Li, Ronny Sutarto, Feizhou He, Chongzhao Wu, Jiaxin Zhu, Yifei Sun, Koushik Ramadoss, Stephen S. Nonnenmann, Nanfang Yu, Riccardo Comin, Karin M. Rabe, Subramanian K.R.S. Sankaranarayanan, Shriram Ramanathan
Although oceans comprise over seventy percent of our planet, they are among the least understood ecosystems. Complex three-dimensional marine environments hold important clues into long term effects of climate change, evolutionary consequences, and animal

Self-assembled Layering of Magnetic Nanoparticles in a Ferrofluid onSilicon Surfaces

January 4, 2018
Author(s)
Katharina Theis-Brohl, Erika C. Vreeland, Andrew Gomez, Dale L. Huber, Apurve Saini, Max Wolff, Brian B. Maranville, Erik Brok, Kathryn L. Krycka, Joseph Dura, Julie Borchers
This article describes the 3D self-assembly of monodisperse colloidal magnetite nanoparticles from a dilute water-based ferrofluid onto a silicon surface and the dependence of the resultant magnetic structure with applied field. The nanoparticles assemble

Liquid Structure with Nano-Heterogeneity Promotes Cationic Transport in Concentrated Electrolytes

October 10, 2017
Author(s)
Oleg Borodin, Liumin Suo, Mallory Gobet, Xiaoming Ren, Fei Wang, Antonio Faraone, Jing Peng, Marco Olguin, Marshall Schroeder, Michael S. Ding, Eric Gobrogge, Arthur von Wald Cresce, Stephen Munoz, Joseph Dura, Steve Greenbaum, Chunsheng Wang, Kang Xu
Using molecular dynamics simulations, small angle neutron scattering and a variety of spectroscopic techniques, we evaluated the ion solvation and transport behaviors in aqueous electrolytes containing bis(trifluoromethane sulfonyl)imide (LiTFSI). We

Nanolayer Analysis by Neutron Reflectometry

July 18, 2017
Author(s)
Joseph A. Dura, Eric Daniel Rus, Paul Kienzle, Brian B. Maranville
Neutron reflectometry offers unique benefits for nanolayer research in green chemistry by providing accurate depth profiles of thin films and interfaces with sub-nanometer precision under in operando condition of active material in their native

CrO 3 Based Proton Conductors

November 1, 2016
Author(s)
Laura Mazzei, Max Wolff, Daniele Pergolesi, Joseph Dura, Lars Borjesson, Philipp Gutfreund, Marco Bettinelli, Thomas Lippert, Maths Karlsson
Epitaxial thin films of the proton conducting perovskite BaZr 0.53 In 0.47 O 3-δ H^d0.47-2δ, grown by pulsed laser deposition, were investigated in their hydrated and dehydrated conditions through a multi-technique approach with the aim to study the

The Center for Research on Extreme Batteries

September 19, 2016
Author(s)
Eric Wachsman, Cynthia Lundgren, Esther S. Takeuchi, Kang Xu, Chunsheng Wang, Joseph Dura, David L. Jacobson, Kahlil Amine, William Acker
How much would you spend on a battery if your life depended on it? Rarely is that question asked as the vast majority of battery development is focused on bringing down battery cost for wide spread consumer acceptance. However, for many industries

Self Assembly of Magnetic Nanoparticles at Silicon Surfaces

June 21, 2015
Author(s)
Katharina Theis-Brohl, Philipp Gutfreund, Alexei Vorobiev, Max Wolff, Boris P. Toperverg, Joseph Dura, Julie Borchers
Neutron reflectometry was used to study the assembly of magnetite nanoparticles in a water-based ferrofluid close to a silicon surface, Under three conditions, static, under shear and with a magnetic field, the depth profile is extracted. The particles

Pore Collapse and Regrowth in Silicon Electrodes for Rechargeable Batteries

April 21, 2015
Author(s)
Steven C. DeCaluwe, Bal Mukund NMN Dhar, Liwei Huang, Yuping He, Kaikun Yang, Jon P. Owejan, Yiping Zhao, A. Alec Talin, Joseph Dura, Howard Wang
Structure and composition changes of an alumina capped amorphous silicon (a-Si) thin-film anode in a lithium half-cell are measured, in opernado, by neutron reflectivity (NR) and electrochemical impedance spectroscopy. The a-Si anode's thickness expands

Phase Segregation of Sulfonate Groups in Nafion Interface Lamellae, Quantified via Neutron Reflectometry Fitting Techniques for Multi-Layered Structures

August 21, 2014
Author(s)
Steven C. DeCaluwe, Paul A. Kienzle, Pavan Bhargava, Andrew M. Baker, Joseph Dura
Neutron reflectometry analysis methods are developed and used to determine the composition depth profile in cases where the structure is no known a priori. These methods, including statistical methods, sophisticated fitting routines, and coupling multiple

Determination of the Effective Transverse Coherence of the Neutron Wave Packet as Employed in Reflectivity Investigations of Condensed-Matter Structures. I. Measurements

March 27, 2014
Author(s)
Charles F. Majkrzak, Christopher Metting, Brian B. Maranville, Joseph A. Dura, Sushil K. Satija, Terrence J. Udovic, Norman F. Berk
The primary purpose of this investigation is to determine the effective coherent extent of the neutron wave packet transverse to its mean propagation vector k, as prepared in a typical instrument used to study the structure of materials in thin film form

In Situ Neutron Techniques for Studying Lithium Ion Batteries

May 1, 2012
Author(s)
Howard Wang, Robert Gregory Downing, Joseph Dura, Daniel S. Hussey
We review in situ neutron techniques for studying lithium ion batteries. Four neutron measurement techniques, neutron depth profiling (NDP), neutron reflectivity (NR), small angle neutron scattering (SANS), and neutron imaging (NI) are discussed in this

Critical Review of the Current Status of Thickness Measurements for Ultrathin SiO2 on Si, Part V: Results of a CCQM Pilot Study

October 1, 2004
Author(s)
M P. Seah, S J. Spencer, F Bensebaa, I Vickridge, H Danzebrink, Michael Krumrey, T Gross, W Oesterle, E Wendler, B Rheinlander, Yasushi Azuma, I Kojima, N Suzuki, M Suzuki, Shigeo Tanuma, D W. Moon, Hansuek Lee, H Cho, H Y. Chen, A T. Wee, T Osipowicz, J S. Pan, W A. Jordaan, R Hauert, U Klotz, C van der marel, M Verheijen, Y Tamminga, C Jeynes, P Bailey, S Biswas, U Falke, Nhan Van Nguyen, Deane Chandler-Horowitz, James R. Ehrstein, D Muller, Joseph Dura

Comparative Thickness Measurements of SiO 2 /Si Films for Thickness Less than 10 nm

January 1, 2004
Author(s)
Terrence J. Jach, Joseph A. Dura, Nhan V. Nguyen, J R. Swider, G Cappello, Curt A. Richter
We report on a comparative measurement of SiO 2 /Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to 6 nm were

Ultra-thin SiO 2 on Si, Part V: Results of a CCQM Pilot Study of Thickness Measurements

December 1, 2003
Author(s)
M P. Seah, S J. Spencer, F Bensebaa, I Vickridge, H Danzebrink, Michael Krumrey, T Gross, W Oesterle, E Wendler, B Rheinlander, Yasushi Azuma, I Kojima, N Suzuki, M Suzuki, Shigeo Tanuma, D W. Moon, Hansuek Lee, H Cho, H Y. Chen, A T. Wee, T Osipowicz, J S. Pan, W A. Jordaan, R Hauert, U Klotz, C van der marel, M Verheijen, Y Tamminga, C Jeynes, P Bailey, S Biswas, U Falke, Nhan Van Nguyen, Deane Chandler-Horowitz, James R. Ehrstein, D Muller, Joseph Dura