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Search Publications by: Jennifer R Verkouteren (Assoc)

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Displaying 26 - 39 of 39

Verification of a Gas Mask Calibrant

February 19, 2007
Author(s)
Robert A. Fletcher, Jiann C. Yang, George W. Mulholland, R L. King, Michael R. Winchester, D Klinedinst, Jennifer R. Verkouteren, Thomas G. Cleary, David Buckingham, James J. Filliben

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials

New Guidelines for d13C Measurements

April 1, 2006
Author(s)
T Coplen, W A. Brandt, M Gehre, Manfred Groning, HAJ Meijer, Blaza Toman, Jennifer R. Verkouteren
Consistency of 13C measurements can be improved 39-47% by anchoring the 13C scale with two isotopic referencematerials differing substantially in 13C/12C. It isrecommended that 13C values of both organic andinorganic materials be measured and expressed

IMS-Based Trace Explosives Detectors for First Responder Use

September 1, 2005
Author(s)
Jennifer R. Verkouteren, John G. Gillen, R M. Verkouteren, Robert A. Fletcher, E S. Etz, George A. Klouda, Alim A. Fatah, Philip J. Mattson
The purpose of this document is to establish minimum performance requirements and an associated test method for Ion Mobility Spectrometry (IMS) based trace explosives detectors for use by the first responder community. Information concerning the theory and

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004
Author(s)
John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion

Bevel Depth Profiling SIMS for Analysis of Layer Structures

September 1, 2003
Author(s)
John G. Gillen, Scott A. Wight, P Chi, Albert J. Fahey, Jennifer R. Verkouteren, Eric S. Windsor, D. B. Fenner
We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or cesium

Analysis of Kaolinite/Chrysotile Mixtures by Ashing and X-Ray Diffraction

September 1, 2002
Author(s)
Jennifer R. Verkouteren, Eric S. Windsor, Joseph M. Conny, R L. Perkins, J T. Ennis
A simple ashing procedure is described that converts kaolinite to amorphous metakaolinite while retaining the diffraction intensity of chrysotile. This ashing procedure removes the XRD pattern overlap between kaolinite and chrysotile that can interfere

Amphibole Asbestos From Libby, Montana: Aspects of Nomenclature

October 1, 2000
Author(s)
A G. Wylie, Jennifer R. Verkouteren
Richterite-asbestos and winchite-asbestos are not listed in the Federal regulations governing asbestos. However, asbestiform winchite is found in the gangue at the Libby, Montana, vermiculite deposit, where asbestos-related diseases have been reported

New Low-Index Liquid Refractive Index Standard: SRM 1922

June 1, 2000
Author(s)
Jennifer R. Verkouteren, Stefan D. Leigh
A new standard for the calibration of refractometers has been developed. Standard Reference Material (SRM) 1922 is a mineral oil with a refractive index n D=1.46945 at 20 C, which is within the range of the Brix scale (% sucrose). The change in index with

SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry

August 1, 1999
Author(s)
Robert A. Fletcher, Jennifer R. Verkouteren, Eric S. Windsor, David S. Bright, Eric B. Steel, John A. Small, Walter S. Liggett Jr
Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than a