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Displaying 1 - 25 of 36

Manganese-Enhanced Magnetic Resonance Microscopy of Mineralization

October 12, 2021
Author(s)
I Chesnick, T Todorov, J M. Centeno, Dale Newbury, John A. Small, K Potter
Paramagnetic manganese (II) can be employed as a calcium surrogate to enhance the sensitivity of the magnetic resonance microscopy (MRM) technique to the processing of calcium during the bone formation process. At high doses, osteoblasts can take up

Microscopy and Microanalysis of Individual Collected Particles- Chapter 10

July 5, 2011
Author(s)
Robert A. Fletcher, Nicholas W. Ritchie, Ian M. Anderson, John A. Small
This chapter describes microscopy and microanalysis techniques used for the characterization of collected, individual particles in a variety of instruments. The instruments discussed are the light microscope, electron microscopes (both scanning and

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

Electron Microprobe Characterization of Si-Ge Alloys and Films for Use as Microanalysis Reference Materials

October 16, 2008
Author(s)
Ryna B. Marinenko, Shirley Turner, Dale E. Newbury, Robert L. Myklebust, Lee L. Yu, Rolf L. Zeisler, David S. Simons, John A. Small
Bulk SiGe wafers cut from single-crystal boules and SiGe thick films on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference standards needed by the microelectronics industry in

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials

Electron Probe Microanalysis with Cryogenic Detectors

July 9, 2005
Author(s)
Dale E. Newbury, Kent D. Irwin, Gene C. Hilton, David A. Wollman, John A. Small, John M. Martinis
Electron probe x-ray microanalysis is based upon the use of a focused, high current density electron beam, 5 keV to 30 keV in energy, to excite characteristic x-rays from a picogram mass of a solid target. X-ray spectral measurements are currently

High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials

March 21, 2005
Author(s)
Dale E. Newbury, J H. Scott, Scott A. Wight, J T. Armstrong, John A. Small
Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectrometry

Electron Probe Microanalysis

January 1, 2005
Author(s)
Dale Newbury, Kent D. Irwin, Gene C. Hilton, David A. Wollman, John A. Small, John M. Martinis

A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems

December 31, 2002
Author(s)
John A. Small, Dale Newbury, John Henry J. Scott, L. King, Sae Woo Nam, Kent D. Irwin, Steven Deiker, Shaul Barkan, Jan Iwanczyk
NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer (υcal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The instrument

The Analysis of Particles at Low Accelerating Voltages (

November 1, 2002
Author(s)
John A. Small
In recent years, there have been a series of advancements in electron beam instruments and x-ray detectors which may make it possible to improve significantly the quality of results from the quantitative electron-probe analysis of individual particles

The Development of Microcalorimeter EDS Arrays

November 1, 2002
Author(s)
Kent D. Irwin, James A. Beall, Steven Deiker, Gene C. Hilton, L. King, Sae Woo Nam, Dale Newbury, Carl D. Reintsema, John A. Small, Leila R. Vale
High-energy-resolution cryogenic microcalorimeters are a powerful new tool for x-ray microanalysis. With demonstrated energy resolution 20 times better than with conventional semiconductor EDS, microcalorimeters are useful in applications such as nanoscale

Electron Backscatter Diffraction (EBSD) of Single Particles

February 1, 2002
Author(s)
John A. Small
Over the years several different methods have been developed for the quantitative x-ray microanalysis of individual particles Small (1981), Armstrong (1991). Despite the large number of quantitative methods available, the accuracy for the x-ray

Energy Dispersive X-ray spectromety by Microcalorimetry for the SEM

January 1, 2002
Author(s)
Dale E. Newbury, David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, John A. Small, John M. Martinis
Analytical x-ray spectrometry for electron beam instruments has been significantly advanced with the development of the NIST microcalorimeter energy dispersive x-ray spectrometer (mcal EDS). The mcal EDS operates by measuring the temperature rise when a

Comparison of High- and Low-Voltage X-Ray Mapping of an Electronic Device

February 1, 2001
Author(s)
John A. Small, David S. Bright
In recent years, field-emission gun scanning electron microscopes, FEG-SEMs, with high-brightness electron guns and excellent performance at low electron beam energies (E 0 less then or equal to 5 keV) have become readily available. Concurrently the

Chapter 12: Analysis of Individual Collected Particles

January 1, 2001
Author(s)
Robert A. Fletcher, John A. Small, J H. Scott
This chapter describes microscopes and microprobes used for analysis of collected, individual particles. The instruments discussed are the light microscope, electron microscopes (scanning, environmental and transmission), electron microprobes, laser