U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Christopher W. Meyer (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 26 - 50 of 54

Determination of SPRT Realization Uncertainties Between Points

September 6, 2006
Author(s)
Christopher W. Meyer, Dean C. Ripple
Calibrated Standard Platinum Resistance Thermometers (SPRTs) are used to realize the International Temperature Scale of 1990 (ITS-90) from 13.8033 K to 1234.93 K. The SPRTs are calibrated at a series of fixed points, each assigned a temperature on the ITS

Temperature Measurements of Microhotplates Using Fluorescence Thermometry

March 1, 2006
Author(s)
Christopher W. Meyer, Douglas C. Meier, Christopher B. Montgomery, Stephen Semancik
A fluorescence microscope has been constructed for measuring surface temperatures of microhotplate platforms. The microscope measures temperature-dependent fluorescence lifetimes of a film of the phosphor Mg4(F)GeO6:Mn which is deposited on the

CCT Key Comparison No 1 (CCT-K1): Realisations of the ITS-90, 0.65 K to 24.5561 K, Using Rhodium-Iron Resistance Thermometers

June 1, 2004
Author(s)
R L. Rusby, Christopher W. Meyer, Weston L. Tew, D I. Head, K D. Hill, O Tamura, P A. de Groot, B Fellmuth, A Storm, A Peruzzi, J Engert, D N. Astrov, Y Dedikov, G A. Kytin
At its meeting in 1996 the CCT initiated five Key Comparisons to test the equivalence of realisations of the ITS-90 between National Measurement Institutes. CCT-K1 covers the temperature range from 0.65 K to 24.5561 K, in which the ITS-90 is defined by

Calibration of Radiation Thermometers in Rapid Thermal Processing Tools Using Si Wafers with Thin Film Thermocouples

October 1, 2003
Author(s)
Kenneth G. Kreider, William A. Kimes, Christopher W. Meyer, Dean C. Ripple, Benjamin K. Tsai, D H. Chen, D P. DeWitt
Rapid thermal processing (RTP) tools are currently monitored and controlled with lightpipe radiation thermometers (LPRTs) which have been calibrated with thermocouple instrumented wafers. We have developed a thin-film thermocouple wafer that enables more

A Four-Zone Furnace for Realization of Silver and Gold Freezing Points

September 1, 2003
Author(s)
Dean C. Ripple, K Garrity, Christopher W. Meyer
Recently, the Thermocouple Calibration Laboratory at the National Institute of Standards and Technology has used sodium heat-pipe furnaces for the realization of ITS-90 freezing points of aluminum, silver, and gold. When using a fixed-point cell mounted in

Recent Results of NIST Realizations of the ITS-90 Below 84 K

January 1, 2003
Author(s)
Weston L. Tew, Christopher W. Meyer
The results at NIST of realizations and comparisons of the ITS-90 below 84 K are presented. The 3He and 4He vapor pressure scales (0.65 K to 5.0 K), and the interpolating constant volume gas thermometer (ICVGT) scale (5.0 K to 24.556 K) as realized from

The NIST Low Temperature ITS-90 Realization and Calibration Facilities

October 1, 2002
Author(s)
Christopher W. Meyer, Weston L. Tew
Two facilities have been constructed at NIST for realizing and maintaining the ITS-90 below 84 K. The first facility is an integrated low temperature realization system that realizes the ITS-90 below 84 K in its entirety and which we refer to as the Low

Wafer Emissivity Effects on Light Pipe Radiometry in RTP Tools

May 1, 2002
Author(s)
Kenneth G. Kreider, David W. Allen, D H. Chen, D P. DeWitt, Christopher W. Meyer, Benjamin K. Tsai
We investigated the effect of different wafer emissivities and the effect of low emissivity films on RTP wafer temperature measurements using light pipe radiation thermometers (LPRTs). These tests were performed in the NIST RTP test bed. We used a NIST

Effects of Wafer Emissivity on Light-Pipe Rediometry in RTP Tools

September 1, 2001
Author(s)
Kenneth G. Kreider, David W. Allen, D H. Chen, D P. DeWitt, Christopher W. Meyer, Benjamin K. Tsai
We investigated the effect of different wafer emissivities and the effect of low emissivity films on rapid thermal processing (RTP) wafer temperature measurements using lightpipe radiation thermometers (LPRTs). These tests were performed in the NIST RTP

The Kelvin and Temperature Measurements

January 1, 2001
Author(s)
Billy W. Mangum, G T. Furukawa, Kenneth G. Kreider, Christopher W. Meyer, Dean C. Ripple, Gregory F. Strouse, Weston L. Tew, Robert D. Saunders, Bettye C. Johnson, Howard W. Yoon, Michael R. Moldover, Charles E. Gibson
The International Temperature Scale of 1990 (ITS90) is defined from 0.65 K upwards to the highest temperature measurable by spectral radiation thermometry, the radiation thermometry being based on the Planck radiation law. Part I of this paper describes

Characterization of Lightpipe Radiation Thermometers for the NIST Test Bed

September 1, 2000
Author(s)
Benjamin K. Tsai, Christopher W. Meyer, Francis J. Lovas
For the past decade, lightpipe radiation theromoeters (LPRTs) have become the sensors of choice in rapid thermal processing (RTP) applications because of their non-intrusiveness and ease of use. In this paper, we discuss the importance of proper LPRT

Calibration of Lightpipe Radiation Thermometers in a RTP Tool at 1000 C

April 1, 2000
Author(s)
Kenneth G. Kreider, D P. DeWitt, Christopher W. Meyer, Vincent P. Scheuerman
We are developing an instrumented calibration wafer for radiometric temperature measurements in rapid thermal processing (RTP) that uses Pt/Pd wire and noble metal thin-film thermocouples that are welded to thin-film pads of Pt. The Pt/Pd wire

Non-Uniquenes of the ITS-90 From 13.8033 K to 24.5561 K

June 1, 1999
Author(s)
Christopher W. Meyer, Gregory F. Strouse, Weston L. Tew
The International Temperature Scale of 1990 (ITS-90) is defined in the region 3.0 K to 24.5561 K by an interpolating constant volume gas thermometer (ICVGT) that is calibrated at three specified fixed points. From 13.8033 K to 1234.93 K the ITS-90 is

Primary Acoustic Thermometry From 217 K to 303 K

April 1, 1999
Author(s)
Michael R. Moldover, S J. Boyes, A R. Goodwin, Christopher W. Meyer
We report new values for the difference (T T 90) between Kelvin thermodynamic temperatures T and ITS-90, the International Temperature Scale of 1990. The new data span the range 217 K {less then or equal to} T 303 K with standard uncertainties of 0.6 mK. A