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Search Publications by: Albert Henins (Ctr)

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Displaying 26 - 50 of 74

Crystalline domain size and faulting in the new NIST SRM 1979 zinc oxide

September 6, 2013
Author(s)
James P. Cline, David R. Black, Albert Henins, John E. Bonevich, Whitfield S. Pam, Paolo Scardi, Matteo Leoni
A NIST SRM certified to address the issue of crystallite size measurement through a line profile analysis has been under development for several years. In order to prepare the feedstock for the SRM, nano-crystalline zinc oxide was produced from thermal

Reply to “Comment on "Testing Three-body Quantum Electrodynamics with Trapped Ti20+ Ions: Evidence for a Z-Dependent Divergence between Experiment and Calculation"

April 12, 2013
Author(s)
Lawrence T. Hudson, C T. Chantler, M N. Kinnane, John D. Gillaspy, A.T. Payne, L F. Smale, Albert Henins, Joshua M. Pomeroy, J A. Kimpton, E Takacs, K Makonyi
We find that Epp’s [1] hypothesis - namely that the current experimental data set is well represented by a small constant or zero offset from the predictions of Artemyev et al. [2] - is not supported by standard statistical analysis. We find that adding

Testing Three-body Quantum Electrodynamics with Trapped Ti-20 Ions: Evidence for a Z-Dependent Divergence between Experiment and Calculation

October 10, 2012
Author(s)
Lawrence T. Hudson, C T. Chantler, Mark N. Kinnane, John D. Gillaspy, A.T. Payne, L F. Smale, Albert Henins, Joseph N. Tan, J A. Kimpton, E Takacs, K Makonyi, Joshua M. Pomeroy
We report the measurement of the w (1s2p 1P1 ! 1s2 1S0) resonance line transition energy in helium-like titanium. Our result, 4749.85(7) eV, deviates from the most recent ab initio prediction by three times our experimental uncertainty and by many times

Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology

August 6, 2012
Author(s)
David R. Black, Joseph J. Ritter, John E. Bonevich, Albert Henins, James P. Cline
Nano scale zinc oxide powder has been produced using a precise thermal decomposition process from a zinc oxalate precursor powder. The size of the crystallites is determined by the specifics of the thermal processing which were chosen to yield crystallites

Certification of Standard Reference Material 660b

June 1, 2011
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Energetic Photon Spectra from Targets Irradiated by Picoseconds Lasers

April 30, 2011
Author(s)
Lawrence T. Hudson, John F. Seely, Csilla Szabo, Uri Feldman, Hui Chen, Albert Henins
Photon spectra in the energy range 60 keV to 1 MeV were recorded from targets irradiated by the LLNL Titan and LLE EP picosecond lasers. The radiation consisted of K shell radiation, Bremsstrahlung radiation from MeV electrons, and preliminary evidence for

Measurement of equilibrium elemental vapor pressures using x-ray induced fluorescence

March 22, 2011
Author(s)
John J. Curry, Albert Henins, E. G. Estupinan, W. P. Lapatovich, S. D. Shastri
X-ray induced fluorescence is demonstrated as a fast and accurate method for measuring elemental vapor pressures over a wide range of pressures. As such, it may offer a preferable alternative to existing methods such as those based on effusion

Scaling studies with the dual crystal spectrometer at the OMEGA-EP laser facility

October 26, 2010
Author(s)
Lawrence T. Hudson, C.I Szabo, J. Workman, K. Flippo, Uri Feldman, Albert Henins
The dual crystal spectrometer (DCS) is an approved diagnostic at the OMEGA and the OMEGA-EP laser facilities for the measurement of high energy x-rays in the 11 90 keV energy range, e.g., for verification of the x-ray spectrum of backlighter targets of

Standard Reference Material 660b for X-ray Metrology

August 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Certification of NIST Standard Reference Material 640d

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Standard Reference Material 640d for X-ray Metrology

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

October 30, 2009
Author(s)
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on

X-ray measurements at high-power lasers

May 1, 2009
Author(s)
Lawrence T. Hudson, C.I Szabo, Paul Indelicato, G.E. Gumberidze, G Holland, John F. Seely, Albert Henins, M Audebert, S. Bastiani-Ceccotti, E. Tabakhoff, E. Brambrink
Conversion efficiencies of laser light into K x-ray radiation are used to characterize laser-solid interactions e.g. in measurements with back-lighter targets in Inertial Confinement Fusion research or in ultra short x-ray science where ultra short laser

Accurate Determination of High Energy Gamma-Ray Standards

October 16, 2008
Author(s)
Ernest G. Kessler Jr., Maynard S. Dewey, R Deslattes, Albert Henins, H G. Borner, M Jentschel, H Lehmann
The extension of accurate crystal diffraction spectroscopy to the 2 to 6 MeV region is described. Gamma-ray standards with a relative uncertainty of (2 to 5)x10 -7 are obtained by measuring the small diffraction angles (a few tenths of a degree) through