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Displaying 226 - 250 of 351

Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements

October 1, 2000
Author(s)
Simon G. Kaplan, Leonard M. Hanssen
A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a high

Optical Properties of Materials: A Sampling of NIST Contributions

January 1, 2000
Author(s)
Thomas A. Germer, R Gupta, Leonard M. Hanssen, Eric L. Shirley
Optics has found an extremely wide range of applications in industry and science, and the properties of the materials that make up optical instruments are key to their performance. Examples include glass for optical instrumentation such as telescopes and

FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

July 19, 1999
Author(s)
Simon G. Kaplan, Leonard M. Hanssen
A Fourier transform infrared (FT-IR) spectrometer-based broadband infrared ellipsometer has been developed around a pair of high-quality Brewster angle polarizers. These polarizers consist of four Ge plates in a chevron geometry and have been measured to