U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: J Greg Gillen (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 51 - 75 of 110

NIST Program to Support Testing and Evaluation of Trace Explosive Detection

October 1, 2007
Author(s)
R M. Verkouteren, John G. Gillen, Jennifer R. Verkouteren, Robert A. Fletcher, Eric S. Windsor, Wayne Smith
Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and

Inkjet Metrology and Standards for Ion Mobility Spectrometry

September 1, 2007
Author(s)
R M. Verkouteren, J Brazin, Eric S. Windsor, Robert A. Fletcher, R Maditz, Wayne Smith, John G. Gillen
Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference materials, calibration services, and other standards for the IMS detection of trace contraband

Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects

February 1, 2007
Author(s)
Christine M. Mahoney, Albert J. Fahey, John G. Gillen, Chang Xu, James Batteas
Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 C to 125 C where the primary glass transition for PMMA occurs at 105 C. The

Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics

February 1, 2007
Author(s)
Christine M. Mahoney, Albert J. Fahey, John G. Gillen
Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was used to depth profile Poly(methyl methacrylate) (PMMA) at a series of temperatures from -75 oC to 125 oC, where the primary glass transition for PMMA occurs at 105

Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS

January 1, 2007
Author(s)
K J. Kim, D Moon, C J. Park, David S. Simons, J Greg Gillen, H Jin, H Kang
Quantitative surface analysis of Fe-Ni alloy thin films has been proposed as a new subject for a pilot study by the surface analysis working group of the Consultative Committee for Amount of Substance (CCQM). Three Fe-Ni alloy films with different

Piezoelectric Trace Vapor Calibrator

August 1, 2006
Author(s)
R M. Verkouteren, John G. Gillen, David Taylor
The design and performance of a vapor generator for calibration and testing of trace chemical sensors are described. The device utilizes piezoelectric nozzles to dispense and vaporize precisely known amounts of analytic solutions onto a hot ceramic surface

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials

3D Molecular Imaging SIMS

July 1, 2006
Author(s)
John G. Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF 5+ polyatomic primary

Performance of a C 60 + Ion Source on a Dynamic SIMS Instrument

July 1, 2006
Author(s)
Albert J. Fahey, John G. Gillen, P Chi, Christine M. Mahoney
An IonOptika [1] C60+ ion source has been fitted onto a CAMECA [1] ims-4f. Stable ion beams of C60+ and C602+ have been obtained with typical currents approaching 20 nA under conditions that allow for several days of source operation. The beam has been

IMS-Based Trace Explosives Detectors for First Responder Use

September 1, 2005
Author(s)
Jennifer R. Verkouteren, John G. Gillen, R M. Verkouteren, Robert A. Fletcher, E S. Etz, George A. Klouda, Alim A. Fatah, Philip J. Mattson
The purpose of this document is to establish minimum performance requirements and an associated test method for Ion Mobility Spectrometry (IMS) based trace explosives detectors for use by the first responder community. Information concerning the theory and

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004
Author(s)
John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion