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Displaying 1 - 25 of 37

Enhanced Near-Field Raman Spectroscopy

October 12, 2021
Author(s)
C E. Dentinger, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
Near-field Raman spectroscopy can be used to obtain chemical specificity with the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). We report detailed measurements of near-field Raman spectra from a single crystal diamond

Standard Reference Data Workshop Report

June 12, 2018
Author(s)
Debra L. Kaiser, Neil Alderoty, Richard R. Cavanagh, Barbara Guttman, Robert J. Hanisch, Adam G. Morey, Jeanita Pritchett, Yuri Ralchenko, Stacy S. Schuur, William E. Wallace
On October 17, 2017, the ODI sponsored a day-long Standard Reference Data Workshop. More than 120 NIST staff members and associates from four NIST laboratories and three offices registered for this workshop. The workshop format consisted of presentations

Workshop on Purity and Dispersion Measurement Issues of Single Wall Carbon Nanotubes (SWCNTs)

February 19, 2017
Author(s)
Stephen W. Freiman, Richard R. Cavanagh, C K. Montgomery, Thomas J. Shaffner, S Arepalli, B Files, P Nikolaev
This document is an executive summary of a workshop organized jointly by the National Aeronautics and Space Administration, Lyndon B. Johnson Space Center (NASA/JSC) and the National Institute of Standards and Technology (NIST) was held on May 27-29, 2003

Chemical Science and Technology Laboratory (CSTL) 2009 Annual Report

November 17, 2009
Author(s)
Willie E. May, Richard R. Cavanagh, Dianne L. Poster, Michael D. Amos
CSTL is entrusted with building, sustaining, and maximizing the chemical measurement system that is criticial to chemical technological innovation, economic competitiveness and new job growth for the benefit of the Nation.

Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NSOM

Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational

Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy

September 1, 2000
Author(s)
Chris A. Michaels, C E. Dentinger, Lee J. Richter, D B. Chase, Richard R. Cavanagh, Stephan J. Stranick
Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface

Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images

August 1, 1999
Author(s)
Lee J. Richter, C E. Dentinger, Richard R. Cavanagh, Garnett W. Bryant, A Liu, Stephan J. Stranick, C D. Keating, M J. Natan
We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This dependence is

Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy

June 1, 1999
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope

July 1, 1998
Author(s)
Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is used to