Publications

Displaying 26 - 35 of 35

SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry

August 1, 1999

Author(s)

Robert A. Fletcher, Jennifer R. Verkouteren, Eric S. Windsor, David S. Bright, Eric B. Steel, John A. Small, Walter S. Liggett Jr

Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than a

Fractal Dimension of Particle Outlines: Meaning, Utility, Limitations, Standard Images and Examples

April 1, 1999

Author(s)

David S. Bright

Only a handful of shape parameters, such as aspect ratio and circularity, are in common use for characterizing individual microscopic particles. The fractal dimension, D, is seeing increased use as an additional shape parameter because particle shapes

Logarithmic 3-Band Color Encoding: A Robust Method for Display and Comparison of Compositional Maps in Electron Probe X-Ray Microanalysis

January 1, 1999

Author(s)

Dale E. Newbury, David S. Bright

Digitally-recorded electron-excited x-ray maps are processed in a variety of ways to improve the visibility of features. Scaling of the recorded signal to match the 8-bit gray scale intensity range of a typical computer display system is almost always

X-Ray Mapping with Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry in the Scanning Electron Microscope: A Tutorial

January 1, 1999

Author(s)

Dale E. Newbury, David S. Bright

X-ray mapping is one of the most popular modes for displaying information obtained with x-ray spectrometry performed in the scanning electron microscope.Although the interpretation of x-ray images obtained with a modern digital control and recording system

Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope

July 1, 1998

Author(s)

John G. Gillen, Scott A. Wight, David S. Bright, T M. Herne

Fluorinated alkanethiol self assembled monolayers (SAM) films immobilized on gold substrates have been used as electron-sensitive resists to map quantitatively the spatial distribution of the primary electron beam scattering in an environmental scanning