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NIST Authors in Bold

Displaying 276 - 300 of 74014

Knowledge Management for Data Analytics in Additive Manufacturing

November 21, 2023
Author(s)
Yeun Park, Paul Witherell, Albert T. Jones, Hyunbo Cho
As a multi-staged digital manufacturing process, Additive manufacturing (AM) inherently benefits from data analytics (DA) decision-making opportunities. The abundance of data associated with the various observations and measurements taken throughout the

2023 NIST Summary of U.S. Legal Metrology Activities

November 20, 2023
Author(s)
Lisa Warfield, Katrice Lippa, Jan Konijnenburg, Loren Minnich, Gloria Diane Lee, Juana Williams, John McGuire
The NIST Office of Weights and Measures (OWM) presents its second issue of the 2023 NIST Annual Summary of U.S. Legal Metrology Activities report. This report includes a summary of changes made to NIST Handbook 44 (2023) Specifications, Tolerances and

Monitoring Spectrometer Drift with Unsupervised Machine Learning

November 20, 2023
Author(s)
Benjamin Harding, Ziling Hu, Ashley Hiett, Frank Delaglio, Katherine Henzler- Wildman, Chad Rienstra
Solid-state NMR spectroscopy (SSNMR) is a powerful technique to probe structural and dynamic properties of molecules at an atomic level. Modern SSNMR methods employ multidimensional pulse sequences requiring data collection over a period of days to weeks

Robust Measurements for RF Fingerprinting with Constellation Patterns of Radiated Waveforms

November 20, 2023
Author(s)
Ameya Ramadurgakar, Jake Rezac, Lennart Heijnen, Kate Remley, Dylan Williams, MELINDA PIKET-MAY, Rob Horansky
We introduce a type of RF fingerprint for nondestructive, cellular device identification. The new fingerprinting algorithm, termed Eigenphones, is a data-driven technique based on a singular value decomposition of a user equipment's symbol-constellation

Scalable and robust beam shaping using apodized fish-bone grating couplers

November 20, 2023
Author(s)
Chad Ropp, Dhriti Maurya, Alexander Yulaev, Daron Westly, Gregory Simelgor, Vladimir Aksyuk
Efficient power coupling between guided and free-space optical modes requires precision spatial mode matching with apodized Bragg gratings. Yet, grating apodizations are often limited by the minimum feature size realizable by the fabrication approach

Cryptographic Module Validation Program (CMVP) Security Policy Requirements

November 17, 2023
Author(s)
David Hawes, Alexander Calis, Roy Crombie
NIST Special Publication (SP) 800-140Br1 is to be used in conjunction with ISO/IEC 19790 Annex B and ISO/IEC 24759 Section 6.14. This Special Publication modifies only those requirements identified in this document. NIST SP 800-140Br1 also specifies the

Enterprise Impact of Information & Communications Technology Risk

November 17, 2023
Author(s)
Stephen Quinn, Nahla Ivy, Matthew Barrett, Larry Feldman, Daniel Topper, Greg Witte, Karen Scarfone, Robert Gardner, Julie Chua
All enterprises should ensure that information and communications technology (ICT) risk receives appropriate attention within their enterprise risk management (ERM) programs. This document is intended to help individual organizations within an enterprise

Information and Communications Technology (ICT) Risk Outcomes

November 17, 2023
Author(s)
Stephen Quinn, Nahla Ivy, Karen Scarfone, Matthew Barrett, Larry Feldman, Daniel Topper, Greg Witte, Robert Gardner, Julie Chua
The increasing frequency, creativity, and severity of technology attacks means that all enterprises should ensure that information and communications technology (ICT) risk is receiving appropriate attention within their enterprise risk management (ERM)

Small Corrections to 1989 NIST Constant-Volume Gas Thermometry Data

November 17, 2023
Author(s)
Allan H. Harvey
Constant-volume gas thermometry data published in 1989 for the difference between the thermodynamic temperature and the International Practical Temperature Scale of 1968 are corrected in two ways. A refined estimate of the thermal expansivity of the

Spatial attribution of aircraft mass balance experiment CO2 estimations for policy relevant boundaries: New York City

November 17, 2023
Author(s)
Jay M. Tomlin, Israel Lopez Coto, Kristian D. Hajny, Joseph R. Pitt, Robert Kaeser, Brian H. Stirm, Thilina Jayarathne, Cody R. Floerchinger, Roisin Commane, Paul B. Shepson
To effectively address the unprecedented acceleration of climate change, cities across the U.S. are leading efforts to reduce greenhouse gas emissions. Coherent, aggressive, and lasting mitigation policies in controlling carbon emissions are beginning to

Direct-Laser-Written Polymer Nanowire Waveguides for Broadband Single Photon Collection from Epitaxial Quantum Dots into a Gaussian-like Mode

November 16, 2023
Author(s)
Edgar Perez, Cori Haws, Marcelo Davanco, Jindong Song, Luca Sapienza, Kartik Srinivasan
Single epitaxial quantum dots (QDs) are a leading technology for quantum light generation, particularly when they are embedded in photonic geometries that enhance their emission into a targeted and confined mode. However, coupling this mode into a

EOS-CG-2021: A Mixture Model for the Calculation of Thermodynamic Properties of CCS Mixtures

November 16, 2023
Author(s)
Tobias Neumann, Stefan Herrig, Ian Bell, Robin Beckmuller, Eric W. Lemmon, Monika Thol, Roland Span
Thermodynamic properties for CCS-relevant mixtures can be calculated with the fundamental equation of state presented in this work over wide ranges of pressure, temperature, and composition for gas, liquid, and supercritical states, as well as phase

Analysis of Neural Network Detectors for Network Attacks

November 15, 2023
Author(s)
Qingtian Zou, Lan Zhang, Anoop Singhal, Xiaoyan Sun, Peng Liu
While network attacks play a critical role in many advanced persistent threat (APT) campaigns, an arms race exists between the network defenders and the adversary: to make APT campaigns stealthy, the adversary is strongly motivated to evade the detection

Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz

November 15, 2023
Author(s)
Rob Jones, Jerome Cheron, Bryan Bosworth, Ben Jamroz, Dylan Williams, Miguel Urteaga, Ari Feldman, Peter Aaen
In this paper, we investigate the effect of two calibration errors, probe placement and capacitance per unit length, on transistor characterization from 220 GHz to 325 GHz on both a microstrip and an inverted coplanar waveguide with a via stitched ground
Displaying 276 - 300 of 74014