NIST Authors in Bold
Displaying 576 - 600 of 674 Nanometrology - FY 2003 Program and Selected Accomplishments
C M. Allocca, Stephen W. Freiman
Value Assignment and Uncertainty Estimation of Selected Light Stable Isotope Reference Materials: RMs 8543-8545, RMs 8562-8564, and RM 8566
R M. Verkouteren, D Klinedinst
Tools and Procedures for Quantitative Microbeam Isotope Ratio Imaging by Secondary Ion Mass Spectrometry
John G. Gillen, David S. Bright
Ferroelectric Phase Transitions in Nano-Scale Chemically Ordered PbSc0.5Nb0.5O3 Using a First-Principles Model Hamiltonian
U Waghmare, Eric J. Cockayne, Benjamin P. Burton
Isotopic Metrology of Carbon Dioxide. II. Effects of Ion Source Materials, Conductance Emission, and Accelerating Voltage on Dual-Inlet Cross Contamination
R M. Verkouteren, S Assonov, D Klinedinst, W Brand
Isotopic Metrology of Carbon Dioxide. I. Interlaboratory Comparison and Empirical Modeling of Inlet Equilibration Time, Inlet Pressure, and Ion Source Conductance
R M. Verkouteren, C E. Allison, S A. Studley, K J. Leckrone
Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer
Yong-Gu Lee, Kevin W. Lyons, Thomas W. LeBrun
Implications of Emerging Micro and Nanotechnology
S Brueck, S Picraux, J Belk, Robert Celotta, W Holton, S Janson, W Kuo, D Nagel, P Penz, A Pisano, R Smith, P Stang, G Sutton, W Tolles, R Trew, M. Young
Physics Laboratory: 2002 Activities, Accomplishments and Recognition
Jonathan E. Hardis, William R. Ott, G G. Wiersma
Diffusion Barrier Cladding in Si/SiGe Resonant Interband Tunneling Diodes and Their Patterned Growth on PMOS Source/Drain Regions
N Jin, A T. Rice, P R. Berger, P E. Thompson, C Rivas, R Lake, S Sudirgo, J J. Kempisty, B Curanovic, S L. Rommel, K D. Hirschman, S K. Kurinec, P Chi, David S. Simons, S.J. Chung
Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams
John G. Gillen, Albert J. Fahey
Copper Oxide Precipitates in NBS Standard Reference Material 482
Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright
Fine Particulate Matter Source Attribution for Southeast Texas Using 14C/13C Ratios
K R. Lemire, D T. Allen, George A. Klouda, C. W. Lewis
Analysis of Kaolinite/Chrysotile Mixtures by Ashing and X-Ray Diffraction
Jennifer R. Verkouteren, Eric S. Windsor, Joseph M. Conny, R L. Perkins, J T. Ennis
Highly Charged Ions: Publications of the EBIT Project, 1993-2001, Atomic Physics Division, NIST, Gaithersburg, Maryland
John D. Gillaspy, L P. Ratliff, J R. Roberts, E Takacs
Biogenic Contributions to Atmospheric Volatile Organic Compounds in Azusa, California
George A. Klouda, C. W. Lewis, D C. Stiles, J L. Marolf, W D. Ellenson, W A. Lonneman
Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.
Chad R. Snyder, J P. Looney, M P. Casassa
Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics
Terrence J. Jach, S M. Durbin, A S. Bakulin, David S. Bright, C B. Stagarescu, G Srajer, D. Haskel, J Pedulla
Experimental Data and Model Simulations of Beam Spread in the Environmental Scanning Electron Microscope
Scott A. Wight
Distribution and Retention of 137Cs in Sediments at the Hanford Site, Washington
J P. McKinley, Cynthia J. Zeissler, J M. Zachara, R J. Serne, Richard M. Lindstrom, H T. Schaef, R D. Orr
Isotopic Ratio Measurements by Time-of-Flight Secondary Ion Mass Spectrometry
Albert J. Fahey, S R. Messenger
Simultaneous Multianalyte Detection with a Nanometer-Scale Pore
John J. Kasianowicz, S. E. Henrickson, H H. Weetall, B Robertson