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NIST Authors in Bold

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Forced Edges and Graph Structure

Brian D. Cloteaux
For a degree sequence, its set of forced edges are the edges that appear in every realization of that sequence, while its forbidden edges appear in no

Chalcogenide Topological Insulators

Joseph A. Hagmann
The purpose of this chapter is to introduce the reader to the chalcogenide materials systems that host the topological insulator phase of quantum matter

Crosstalk in microwave SQUID multiplexers

John A. Mates, Daniel T. Becker, Douglas A. Bennett, Bradley J. Dober, Johnathon D. Gard, Gene C. Hilton, Daniel S. Swetz, Leila R. Vale, Joel N. Ullom
Low-temperature detector technologies provide extraordinary sensitivity for applications ranging from precision measurements of the cosmic microwave background

Nano-opto-electro-mechanical switches operated at CMOS-level voltages

Christian Haffner, Andreas Joerg, Michael Doderer, Daniel Chelladurai, Felix Mayor, Comsin Ioan Roman, Yuriy Fedoryshyn, Mikael Mazur, Maurizio Burla, Henri J. Lezec, Vladimir A. Aksyuk, Juerg Leuthold
Reprogrammable optical networks that operate in symbiosis with CMOS electronics promise to advance technologies such as optical neural networks. However

Atomic-scale mechanism of unidirectional oxide growth

Xianhu Sun, Wenhui Zhu, Dongxiang WU, Zhenyu Liu, Xiaobo Chen, Lu Yuan, Guofeng Wang, Renu Sharma, Guangwen Zhou
A fundamental knowledge of the unidirectional growth mechanisms is required for precise control on size, shape, and thereby functionalities of nanostructures

Physics-based Simulation of Agile Robotic Systems

Pavlo Piliptchak, Murat Aksu, Frederick M. Proctor, John L. Michaloski
Development and testing of industrial robot environments is hampered by the limited availability of hardware resources. Simulations provide a more accessible
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