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NIST Authors in Bold

Displaying 26 - 50 of 2383

Comparative study of multiwall carbon nanotube nanocomposites by Raman, SEM, and XPS measurement techniques

March 3, 2021
Author(s)
Yanmei Piao, Vipin Tondare, Chelsea S. Davis, Justin Gorham, Elijah Petersen, Jeffrey W. Gilman, Keana Scott, Andras Vladar, Angela R. Hight Walker
Substantial ongoing research efforts are investigating the production of novel composite material enhanced by the incorporation of nanomaterial fillers such as multiwall carbon nanotubes (MWCNTs). While the addition of MWCNTs have been shown to improve the

Design of an electrostatic balance to measure optical power of 100 kW

February 19, 2021
Author(s)
Lorenz H. Keck, Gordon Shaw, Renee Theska, Stephan Schlamminger
To accommodate the need for increased portability and accuracy in laser power measurement instrumentation above 100 Watt at the National Institute of Standards and Technology (NIST), a new instrument is required. This instrument is intended to create a new

Redefining the kilogram and other SI units

February 10, 2021
Author(s)
Stephan Schlamminger
Units are at the heart of science and technology. Most measurements require units to express their result. The International System of Units (SI) provides a widely used coherent framework of units. While the present SI is fit for purpose for all

National Institute of Standards and Technology Environmental Scan 2020

February 9, 2021
Author(s)
Heather Evans, Kristen Greene, William M. Healy, Elizabeth Hoffman, Kate Rimmer, Anna V. Sberegaeva, Neil M. Zimmerman
The 2020 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the fulfillment of its mission in coming years. The analyses were conducted through four separate lenses

Technology Readiness Levels for Randomized Bin Picking, Performance Metrics for Intelligent Systems (PerMIS) 2012 Workshop, Special Session

February 8, 2021
Author(s)
Jeremy Marvel, Roger D. Eastman, Geraldine S. Cheok, Kamel S. Saidi, Tsai H. Hong, Elena R. Messina, Bob Bollinger, Paul Evans, Joyce Guthrie, Eric Hershberger, Carlos Martinez, Karen McNamara, James Wells
The special session on Technology Readiness Levels (TRLs) for Randomized Bin Picking was held during the morning session of the 2012 Performance Metrics for Intelligent Systems (PerMIS) workshop, 21 March, 2012. The stated objective of the special session

A system of quantities from software metrology

January 15, 2021
Author(s)
David Flater
International Organization for Standardization (ISO)/International Electrotechnical Commission (IEC) 80000, the International System of Quantities, collects and organizes the most important physical quantities into a coherent system of quantities whose

Comparison of primary laser spectroscopy and mass spectrometry methods for measuring mass concentration of gaseous elemental mercury

December 10, 2020
Author(s)
Abneesh Srivastava, Stephen E. Long, James E. Norris, Colleen E. Bryan Sallee, Jennifer Carney, Joseph Hodges
We present a direct comparison between two independent methods for the measurement of gaseous elemental mercury (GEM) mass concentration: isotope dilution cold-vapor inductively coupled plasma mass spectrometry (ID-CV-ICP-MS) and laser absorption

Certification of Standard Reference Material(R) 1992 / ERM(R)-FD305 Zeta Potential – Colloidal Silica (Nominal Mass Fraction 0.15 %)

November 24, 2020
Author(s)
Yannic Ramaye, Vikram Kestens, J. Charoud-Got, S. Mazoua, G. Auclair, Tae Joon Cho, Blaza Toman, Vincent A. Hackley, T. Linsinger
This report describes the production of SRM 1992/ERM-FD305, silica particles suspended in a borate buffer, certified for electrophoretic mobility and zeta potential by electrophoretic light scattering (ELS). This material was produced following ISO 17034

Certification of Standard Reference Material(R) 1993 / ERM(R)-FD306 Zeta Potential – Colloidal Silica (Nominal Mass Fraction 2.2 %)

November 24, 2020
Author(s)
Yannic Ramaye, Vikram Kestens, J. Charoud-Got, S. Mazoua, G. Auclair, Tae Joon Cho, Blaza Toman, Vincent A. Hackley, T. Linsinger
This report describes the production of SRM 1993/ERM-FD306, silica particles suspended in a borate buffer, certified for electrophoretic mobility and zeta potential by electrophoretic light scattering (ELS). This material was produced following ISO 17034

Calibration Procedures for Orthogonal Superposition Rheology

November 18, 2020
Author(s)
Ran Tao, Aaron M. Forster
Orthogonal superposition (OSP) rheology is an advanced rheological technique that involves superimposing a small-amplitude oscillatory shear deformation orthogonal to a primary shear flow. This technique allows the measurement of structural dynamics of

Error Quantification in Dynamic Applications of Weakly Nonlinear Transducers

November 3, 2020
Author(s)
Lautaro D. Cilenti, Akobuije Chijioke, Balakumar Balachandran
Characterization and quantification of dynamic measurements is an ongoing area of research in the metrological community as new calibration methods are being developed to address dynamic measurement applications. The development undertaken to date largely

Materials Research & Measurement Needs for Ceramics Additive Manufacturing

November 1, 2020
Author(s)
Andrew J. Allen, Igor Levin, Suzanne E. Witt
We report on a recent workshop dedicated to additive manufacturing (AM) of ceramics that was held at the National Institute of Standards and Technology (NIST) in November 2019. This two- day all-invited meeting brought together experts from industry

Report of the 104th National Conference on Weights and Measures

August 27, 2020
Author(s)
Yvonne A. Branden, Tina G. Butcher, Richard A. Harshman, Lisa Warfield, Gloria D. Lee, John W. Barton
The 104th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 14 - 18, 2019, at the Hyatt Regency Milwaukee Hotel, Milwaukee, Wisconsin. The theme of the meeting was "Assuring Equity in the Marketplace: NIST and NCWM

Binary pseudorandom array test standard optimized for characterization of large field-of-view optical interferometers

August 24, 2020
Author(s)
Valeriy V. Yashchuk, Sergey Babin, Stefano Cabrini, Weilun Chao, Ulf Griesmann, Ian Lacey, Stefano Marchesini, Keiko Munechika, Carlos Pina-Hernandez, Allen L. Roginsky
Recently, a technique for calibrating the modulation transfer function (MTF) of a broad variety of metrology instrumentation has been demonstrated. This technique is based on test samples structured as one-dimensional binary pseudo-random (BPR) sequences

Evaluation of NMIJ Traveling Dual Source Bridge Using NIST Adapted Wheatstone Bridge

August 24, 2020
Author(s)
Takehiko Oe, Shamith U. Payagala, Dean G. Jarrett, Nobu-Hisa Kaneko
DC high resistance measurement capability has been evaluated using a NMIJ traveling dual source bridge between NIST and NMIJ. The NMIJ bridge determines the resistance ratio by measuring the voltage ratio using a digital multimeter, 3458A. Based on the

Ohms Law Low-current Calibration System for Ionization Chambers

August 24, 2020
Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor in series with a stable voltage source to generate calibration currents from 1 pA to 20 nA

The Design of an Instrument to Realize Small Torque at NIST

August 22, 2020
Author(s)
Leon S. Chao, Rafael Marangoni, Frank C. Seifert, Darine El Haddad, Jon R. Pratt, David B. Newell, Stephan Schlamminger
After the recent redefinition of the International System of Units (SI), torque no longer needs to be traceable to a calibrated mass in a gravitational field suspended from a known lever arm and disseminated through a chain of torque transducers.An SI

A Toolbox for Isophase-Curvature Guided Computation of Metrology Holograms

August 13, 2020
Author(s)
Ulf Griesmann, Johannes A. Soons, Gufran S. Khan
We describe the algorithmic foundations of an open-source numerical toolbox, written in the Octave language, for the creation of computer-generated binary and multi-level holograms used in interferometric form error measurements of complex aspheric and
Displaying 26 - 50 of 2383