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Search Publications

NIST Authors in Bold

Displaying 51 - 75 of 1560

Optimal Series Resistors for On-Wafer Calibrations

November 8, 2019
Author(s)
Jasper A. Drisko, Richard A. Chamberlin, James C. Booth, Nathan D. Orloff, Christian J. Long
The series resistor is a common on-wafer device typically used in the series-resistor calibration and for estimating the capacitance per unit length of coplanar waveguide transmission lines. While much work has been done using series resistors, this paper

Embedding a Rydberg Atom-Based Sensor into an Antenna for Phase and Amplitude Detection of Radio Frequency Fields and Modulated Signals

October 22, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon, David R. Novotny
We demonstrate a Rydberg atom-based sensor embedded in a parallel-plate waveguide (PPWG) for amplitude and phase detection of a radio-frequency (RF) electric field. This embedded atomic sensor is also capable of receiving modulated communications signals

Nanobolometer with ultralow noise equivalent power

October 11, 2019
Author(s)
Roope J. Kokkoniemi, Joonas Govenius, Visa Vesterinen, Russell Lake, A M. Gunyho, K-Y Tan, S Simbierowicz, Leif Gronberg, J Lehtinen, M Prunnila, Juha Hassel, Antti Lamminen, O P. Saira, Mikko Mottonen
Since the introduction of bolometers more than a century ago, they have been used in various applications ranging from chemical sensors, consumer electronics, and security to particle physics and astronomy. However, faster bolometers with lower noise are

Design of an intelligent PYTHON code to run coupled and license-free finite-element and statistical analysis software for calibration of near-field scanning microwave microscopes

October 2, 2019
Author(s)
Jeffrey T. Fong, N. Alan Heckert, James Filliben, Pedro V. Marcal, Samuel Berweger, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
To calibrate near-field scanning microwave microscopes (NSMM) for defect detection and characterization in semiconductors, it is common to develop a parametric finite element analysis (FEA) code to guide the microscope user on how to optimize the settings

Comparison of Multiple Methods for Obtaining PO Resistances with Low Uncertainties

September 3, 2019
Author(s)
Kwang Min Yu, Dean G. Jarrett, Albert Rigosi, Shamith Payagala, Marlin E. Kraft
Capabilities for high resistance determinations are essential for calibration of currents below 1 pA, as typically requested in several applications, including semiconductor device characterization, single electron transport, and ion beam technologies

Detecting and Receiving Phase-Modulated Signals With a Rydberg Atom-Based Receiver

September 2, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon, David R. Novotny
Recently, we introduced a Rydberg-atom based mixer capable of detecting and measuring of the phase of a radio-frequency field through the electromagnetically induced transparency (EIT) and Autler-Townes (AT) effect. The ability to measure phase with this

Machine Learning in a Quality Managed RF Measurement Workflow

July 6, 2019
Author(s)
Aric Sanders, John Bass, Arpita Bhutani, Mary A. Ho, Jim Booth
Advances in artificial intelligence, or more specifically machine learning, have made it possible for computers to recognize patterns as well or better than humans. The process of quality management in radio-frequency measurements is an arduous one that

Electric Field Gradient Reference Material for Scanning Probe Microscopy

March 31, 2019
Author(s)
Joseph Kopanski, Lin You
Any eSPM measurement of a spatially varying electric field at the surface of a sample has a large uncertainty due to the unknown details of the tip shape near the surface. We have designed an electric field gradient reference sample to provide an

A Rydberg Atom-Based Mixer: Measuring the Phase of a Radio Frequency Wave

March 18, 2019
Author(s)
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon
Rydberg atoms have been shown to be very useful in performing absolute measurements of the magnitude of a radio frequency (RF) field using electromagnetically-induced transparency (EIT). However, there has been less success in using Rydberg atoms for the

Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station

January 14, 2019
Author(s)
Duane J. McCrory, Mark Anders, Jason Ryan, Pragya Shrestha, Kin P. Cheung, Patrick M. Lenahan, Jason Campbell
We report on a novel electron paramagnetic resonance (EPR) technique that merges electrically detected magnetic resonance (EDMR) with a conventional semiconductor wafer probing station. This union, which we refer to as wafer-level EDMR (WL-EDMR), allows

Measurement of Ion-Pairing Interactions in Buffer Solutions with Microwave Microfluidics

January 1, 2019
Author(s)
Charles A. Little, Angela C. Stelson, Nathan D. Orloff, Christian J. Long, James C. Booth
Broadband microwave microfluidics is an emerging technique for quantifying the frequency dependent electrical response of fluids in the microwave regime. This technique can access important physical properties including interfacial polarization, ion

Millimeter-Wave Channel Measurement and Modeling: A NIST Perspective

December 7, 2018
Author(s)
Camillo A. Gentile, Peter B. Papazian, Nada T. Golmie, Catherine A. Remley, Peter G. Vouras, Jelena Senic, Jian Wang, Jack Chuang, Ruoyu Sun
The exponential increase in wireless data transmission from smartphones has led to the saturation of the sub-6-GHz bands, forcing cellular providers to migrate to the millimeter-wave (mmWave) regime for 5G. Although available channel bandwidths will grow

Determining Carbon Fiber Composite Loading by Flip-Chip on a Coplanar Waveguide to 110GHz

November 22, 2018
Author(s)
Nina P. Basta, Jasper A. Drisko, Aaron M. Hagerstrom, Joshua A. Orlicki, Jennifer M. Sietins, Daniel B. Knorr, Jr., Edward J. Garboczi, Christian J. Long, Nathan D. Orloff
The electrical properties of materials are a necessary part of any circuit design. As applications at millimeter-wave frequen-cies increase, there is a growing need to develop new materials with low loss and multiple functionalities. Unfortunately, many

Precision Optical Antenna Alignment System for Tracking Antennas in 6-DOF

November 4, 2018
Author(s)
Joshua A. Gordon, David R. Novotny, Michael S. Allman
We present on an all-optical spatial metrology system, the PiCMM, that aids in the alignment and tracking of antennas with accuracies on the order of 25 microns and 0.01 deg. This system speeds up millimeter-wave antenna alignment, does not require contact

Persistence of Electromagnetic Units in Magnetism

October 31, 2018
Author(s)
Ronald B. Goldfarb
The centimeter-gram-second system of electromagnetic units (EMU) has been used in magnetism since the late 19th century. The International System of Units (SI), a successor to Giorgi's 1901 meter- kilogram-second system, was adopted by the General

Using Radiation Pressure to Develop a Radio-Frequency Power Measurement Technique Traceable to the Redefined SI

October 15, 2018
Author(s)
Christopher L. Holloway, Matthew T. Simons, David R. Novotny, John H. Lehman, Paul A. Williams, Gordon A. Shaw
We discuss a power measurement technique traceable to the International System of Units based on radiation pressure (or radiation force) carried by an electromagnetic wave. A measurement of radiation pressure offers the possibility for a power measurement

Uncertainties in Rydberg Atom-based RF E-field Measurements

October 8, 2018
Author(s)
Matthew T. Simons, Marcus D. Kautz, Joshua A. Gordon, Christopher L. Holloway
A new atom-based electric (E) field measurement approach (using Rydberg atoms) is being investigated by several groups around the world as a means to develop a new SI-traceable RF E- field standard. For this technique to be useful it is important to

Spherical Test Objects for Hand-held Metal Detector Characterization

September 12, 2018
Author(s)
Nicholas G. Paulter Jr., Donald R. Larson, John A. Ely
Measuring the detection performance of metal detectors (hand-worn, hand-held, and walk-through models) is based on the observation of an alarm indication (light, sound, vibration) given by the metal detector when a threat or test object is present. These

MEMS non-absorbing electromagnetic power sensor employing the effect of radiation pressure

September 8, 2018
Author(s)
Ivan Ryger, Aly Artusio-Glimpse, Paul A. Williams, Gordon A. Shaw, Matt Simons, Christopher L. Holloway, John H. Lehman
We demonstrate a compact electromagnetic power sensor based on force effects of electromagnetic radiation onto a highly reflective mirror surface. Unlike the conventional power measurement approach, the photons are not absorbed and can be further used in

Determining Carbon Fiber Composite Loading with Flip-Chip Measurements to 110 GHz

September 1, 2018
Author(s)
Nina P. Basta, Aaron Hagerstrom, Jasper A. Drisko, James Booth, Edward Garboczi, Christian Long, Nathan Orloff
— Electrical properties of materials are a necessary part of any circuit design. With emerging applications at millimeter- wave frequencies, there is a need to characterize new materials before they come to market. At frequencies below about 67 GHz, it is
Displaying 51 - 75 of 1560