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Displaying 26 - 50 of 1679

Dopant Location Identification in Nd 3+ -Doped TiO 2 Nanoparticles

October 12, 2021
Author(s)
W Li, A I. Frenkel, Joseph Woicik, C Ni, S I. Shah
Doping large bandgap semiconductors is typically done in order to enhance photocatalytic, photovoltaic and other chemical and optoelectronic properties. The identification of dopant position and its local environment is essential to exploring the doping

Effects of Bond Coat Surface-Roughness on Residual Stresses of Thermal Barrier Coating Systems

October 12, 2021
Author(s)
C H. Hsueh, J Haynes, M Lance, P Becher, M Ferber, Stephen A. Langer, W Carter, W R. Cannon, Lin-Sien H. Lum
The adherence of plasma-sprayed thermal barrier coatings (TBCs) is dependent on mechanical interlocking at the interface between the ceramic top coat and the underlying metallic bond coat. A rough bond coat surface is required in order to establish

Effects of Solution pH and Surface Chemistry on the Post-Deposition Growth of Chemical Bath Deposited PbSe Nanocrystalline Films

October 12, 2021
Author(s)
Shaibai K. Sarkar, Shifi Kababya, Shimon Vega, Hagal Cohen, Joseph Woicik, A I. Frenkel, Gary Hodes
Chemical bath deposited PbSe films were subjected to post-deposition treatment with aqueous (typically 0.25 - 0.5 M) KOH. For films deposited using a citrate complex, this treatment resulted in dissolution of surface lead oxides (seen from XPS and EXAFS

Elastic Modulus Measurements in Plasma Sprayed Deposits

October 12, 2021
Author(s)
Jay S. Wallace, J Ilavsky
A technique has been developed to characterize the elastic modulus of zirconium oxide-8% yttrium oxide plasma sprayed deposits. A commercial hardness indenter has been modified to record load-displacement as a spherical ball is elastically loaded onto the

Electron Backscatter Diffraction Investigation of a Nano-Crystalline Pt Thin Film

October 12, 2021
Author(s)
T Maitland, X Han, Mark D. Vaudin, G R. Fox, M Coy
A polycrystalline Pt thin film deposited on a cut Si single crystal wafer coated with SiO2 and a TiO2 adhesion layer was studied using automated electron backscatter diffraction (EBSD). Integration of the EBSD detector and a scanning electron microscope

Environmentally Enhanced Crack Growth in AlN

October 12, 2021
Author(s)
Roy W. Rice, C C. Wu, K R. McKinney, Stephen W. Freiman, L E. Dolhert, J H. Enloe
Three tests: (1) dynamic fatigue; (2) flexure strength, and (3) direct, double-cantilever beam stress intensity-crack velocity measurements carried out in air (22 C) and liquid nitrogen (-196 C) all showed that dense sintered AlN undergoes slow crack

Ferroics: Magnetic-Compass Lattice and Optical Phonon Dispersions of Dipolar Crystals

October 12, 2021
Author(s)
Takeshi Nishimatsu, U Waghmare, Yoshiyuki Kawazoe, Benjamin P. Burton, Kazutaka Nagao, N. Saito
We report a simple safe and attractive pedagogic demonstration with magnetic compasses that facilitates an intuitive understanding of the concept that ferromagnetism and ferroelectricity do not result from dipole-dipole interactions alone. Phonon

Homological Metrics for Microstructure Response Fields in Polycrystals

October 12, 2021
Author(s)
Lin-Sien H. Lum, D M. Saylor, Thomas Wanner
Quantitative homological metrics are proposed for characterizing the thermal-elastic response of calcite-based polycrystals. The characterization is based on topological measurements, such as the number of components and the number of handles of a complex

Large Negative Poisson's Ratio for SrTiO3 Thin Films Grown on Si(001

October 12, 2021
Author(s)
F S. Aguirre-Tostado, A Herrera-Gomez, Joseph Woicik, R Droopad, Z Yu, D G. Schlom, E Karapetrova, P Pianetta, C S. Hellberg
The driving force of the semiconductor industry to integrate thin transition-metal oxides with Si transistor technology has led to the development of SrTiO3 thin-film growth on Si(001). As SrTiO3 represents a large class of oxides with the perovskite

Layer Perfection in Ultrathin, MOVPE-Grown InAs Layers Buried in GaAs(001) Studied by X-Ray Standing Wave and Photoluminescence Spectroscopy

October 12, 2021
Author(s)
J A. Gupta, Joseph Woicik, S P. Watkins, D A. Harrison, E D. Crozier, B A. Karlin
Using the In-L fluorescence produced by normal-incidence X-ray standing waves, we have measured the layer perfection and positions for ML = 1 and 1/2 (where ML = # of mono layers) InAs quantum wells buried in GaAs(001). Growth temperature effects were

Low Temperature Compaction of Nanosize Powders

October 12, 2021
Author(s)
E J. Gonzalez, Gasper J. Piermarini
In recent years there has been a strong interest in the processing of nanosize ceramic powders because of the potential of sintering them at low temperatures and also because ceramic pieces made of nanosize gram structures may exhibit superior mechanical

Nano/Bioscience and Technology Education for the 21st Century

October 12, 2021
Author(s)
J Jacobs, Winnie Wong-Ng, Gale A. Holmes, Richard F. Kayser
NEW:Update 2005, the 20th annual workshops for science and technology educators with the theme, NANO/BIOSCIENCE AND TECHNOLOGY EDUCATION FOR THE 21ST CENTURY, was hosted by the National Institute of Standards and Technology/Materials Science and

Near-Field Intensity Correlations in Semicontinuous Metal-Dielectric Films

October 12, 2021
Author(s)
K Seal, A K. Sarychev, H Noh, D A. Genov, A Yamilov, Vladimir Shalaev, Z C. Ying, H Cao
Spatial intensity correlation functions are obtained from near-field scanning optical microscope measurements of semicontinuous metal-dielectric films. The concentration of metal particles on a dielectric surface is varied over a wide range to control the

NEXAFS Characterization of Poly(amino acids)

October 12, 2021
Author(s)
N T. Samuel, Daniel A. Fischer, David G. Castner
The near-edge x-ray absorption fine structure (NEXAFS) spectra of poly(amino acids) at the carbon, nitrogen and oxygen k-edges are investigated in this study. The poly(amino acid) NEXAFS spectra at the k-edges closely resemble the spectra of the

NiO: A Charge Transfer or Mott-Hubbard Insulator

October 12, 2021
Author(s)
T M. Schuler, D L. Ederer, S Itza-Ortiz, G T. Woods, T A. Callcott, Joseph Woicik
Using site-specific soft x-ray emission and absoroption spectroscopy in conjunction with site-specific x-ray photoelectron spectroscopy, we measure the magnitude of the insulating band gap of NiO to be approximately 2.0 eV, comparable to that predicted by
Displaying 26 - 50 of 1679