U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 976 - 1000 of 1758

Nanoparticle Size and Shape Evaluation Using the TSOM Method

June 1, 2012
Author(s)
Bradley N. Damazo, Ravikiran Attota, Premsagar P. Kavuri, Andras Vladar
A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be used here for nanoparticle dimensional analysis. The TSOM method can distinguish not only size

Effect of Diamond Nanolubricant on R134a Pool Boiling Heat Transfer

May 21, 2012
Author(s)
Mark A. Kedzierski
This paper quantifies the influence of diamond nanoparticles on the boiling performance of R134a/polyolester mixtures on a roughened, horizontal, flat surface. Nanofluids are liquids that contain dispersed nano-size particles. A lubricant based nanofluid

Microscopy for STEM Educators

May 21, 2012
Author(s)
Michael T. Postek, Mary B. Satterfield, Bradley N. Damazo, Robert Gordon
The future of our nation hinges on our ability to prepare our next generation to be innovators in science, technology, engineering and math (STEM). Excitement for STEM must begin at the earliest stages of our education process. Yet, today far too few of

Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node

April 10, 2012
Author(s)
Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several through

On CD-AFM bias related to probe bending

April 9, 2012
Author(s)
Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Richard M. Silver
Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported on

Optical fiber-coupled cryogenic radiometer with carbon nanotube absorber

April 1, 2012
Author(s)
David J. Livigni, Nathan A. Tomlin, Christopher L. Cromer, John H. Lehman
A cryogenic radiometer was constructed for direct-substitution optical fiber power measurements. The cavity is intended to operate at the 3 K temperature stage of a dilution refrigerator or 4.2 K stage of a liquid cryostat. The optical fiber is removable

Modeling the effects of acid amplifiers on photoresist stochastics

March 23, 2012
Author(s)
Gregg M. Gallatin, Patrick Naulleau, Robert Brainard
The tradeoff between Resolution, Line Edge Roughness (LER) and Sensitivity, the so called RLS tradeoff, continues to be a difficult challenge, especially for EUV lithography. Acid amplifiers have recently been proposed as a method to improve upon the

Tumor Necrosis Factor Interaction with Gold Nanoparticles

March 14, 2012
Author(s)
De-Hao D. Tsai, Sherrie R. Elzey, Frank W. DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael R. Zachariah, Athena M. Keene, Jeffrey D. Clogston, Vincent A. Hackley
We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spectroscopic
Displaying 976 - 1000 of 1758
Was this page helpful?