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NIST Authors in Bold

Displaying 26 - 50 of 2583

Comparison of the detection efficiency calibration of a single-photon avalanche detector between NIST and PTB

September 12, 2023
Author(s)
Hristina Georgieva, Thomas Gerrits, Helmuth Hofer, Anouar Rahmouni, Oliver T. Slattery, Marco Lopez, Joshua Bienfang, Alan Migdall, Stefan Kueck
The detection efficiency of a commercial single-photon avalanche detector (SPAD) has been independently determined at two national metrology institutes, the National Institute of Standards and Technology (NIST) - USA and the Physikalisch-Technische

Multi'omic Characterization of Human Whole Stool RGTMs

September 8, 2023
Author(s)
Amanda L. Bayless, Sandra M. Da Silva, Clay Davis, Abraham Kuri Cruz, Tracey Schock, Stephanie Servetas, Paulina Piotrowski
The gut microbiome plays a critical role in a vast and disparate set of health and disease states, including cancer and obesity. Human fecal is a complex mixture including microbes, proteins, undigested plant matter and fat content according to the diet

Quantifying the Effect of Guest Binding on Host Environment

August 29, 2023
Author(s)
Angela Stelson, Zack Fishman, Jacob Pawlik, Gosia Musial, Jim Booth, Chris Long, Kathleen Schwarz, Nate Orloff, Hugh Ryan, Angela Grommet, Jonathan Nitschke, Felix Rizzuto
The environment around a host-guest complex is defined by of intermolecular interactions between solvent molecules and counter ions. These interactions govern both the solubility of these complexes and the rates of reactions confined within them11. Such

National Institute of Standards and Technology Environmental Scan 2023: Societal and Technology Landscape to Inform Science and Technology Research

August 23, 2023
Author(s)
Ashley Boggs-Russell, Kerrianne Buchanan, David W. Griffith, Heather Evans, Dimitrios Meritis, Lisa Ng, Anna Sberegaeva, Michelle Stephens
The 2023 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the fulfillment of its mission in coming years. The analyses were conducted through three separate lenses

An Evolving Regulatory Landscape for Commercial Electric Vehicle Fueling

August 22, 2023
Author(s)
Tina G. Butcher, Michael Nelson
Plug-in electric vehicles (PEV), which include "all-electric" battery EV (BEV) and plug-in hybrid EV (PHEV), comprise a rapidly growing proportion of the U.S. automobile market – nearly 8% of all light-duty vehicles sold in Oct. 2022, a 41.4% rise over

Fabrication of Specimens for Atom Probe Tomography using a Combined Gallium and Neon Focused Ion Beam Milling Approach

August 16, 2023
Author(s)
Frances Allen, Paul Blanchard, David Pappas, Russell Lake, Deying Xia, John Notte, Ruopeng Zhang, Andrew Minor, Norman A. Sanford
We demonstrate a new focused ion beam sample preparation method for atom probe tomography. The key aspect of the new method is that we use a neon ion beam for the final tip shaping after conventional annulus milling using gallium ions. This dual-ion

Measuring the permittivity tensor of anisotropic DyScO3 to 110 GHz

August 14, 2023
Author(s)
Florian Bergmann, Meagan Papac, Nick Jungwirth, Bryan Bosworth, Tomasz Karpisz, Anna Osella, Lucas Enright, Eric Marksz, Angela Stelson, Chris Long, Nate Orloff
DyScO3 (DSO) is an attractive substrate on which to grow epitaxial thin films with extraordinary materials physics. However, its highly anisotropic permittivity makes some measurements exceedingly difficult: For instance, its permittivity tensor has not

Recommendations for Setting a Criterion for Assessing Commutability of Secondary Calibrator Certified Reference Materials

August 11, 2023
Author(s)
W. Greg Miller, Thomas Keller, Jeffrey Budd, Jesper Johansen, Mauro Panteghini, Neil Greenberg, Vincent Delatour, Ferruccio Ceriotti, Robert Rej, Johanna Camara, Liesbet Deprez, Finlay MacKenzie, Alicia Lyle, Eline van der Hagen, Chris Burns, Pernille Fauskanger, Sverre Sandberg
A secondary higher-order calibrator is required to be commutable with clinical samples to be suitable for use in the calibration hierarchy of an end-user clinical laboratory in vitro diagnostic medical device (IVD-MD). Commutability is a property of a

Accurate measurement of the loss rate of cold atoms due to background gas collisions for the quantum-based cold atom vacuum standard

August 1, 2023
Author(s)
Daniel Barker, James A. Fedchak, Jacek Klos, Julia Scherschligt, Abrar Sheikh, Eite Tiesinga, Stephen Eckel
We present measurements of thermalized collisional rate coefficients for ultra-cold $^7$Li and $^87}$Rb colliding with room-temperature He, Ne, N$_2$, Ar, Kr, and Xe. In our experiments, a combined flowmeter and dynamic expansion system, a vacuum metrology

Non-nulling Protocols for Fast, Accurate, 3-D Velocity Measurements in Stacks

July 28, 2023
Author(s)
Iosif Isaakovich Shinder, Aaron Johnson, James Filla, Vladimir B. Khromchenko, Michael R. Moldover, Joey Boyd, John D. Wright, John R. Stoup
We present protocols for making fast, accurate, 3-D velocity measurements in the stacks of coal-fired power plants. The measurements are traceable to internationally-recognized standards; therefore, they provide a rigorous basis for measuring and/or

2023 NIST OWM S&T Analysis

July 7, 2023
Author(s)
Lisa Warfield, Loren Minnich, Jan Konijnenburg, Gloria Diane Lee, Juana Williams
The NIST OWM Analysis is submitted to assist the Weights and Measures community as it deliberates on items before the 2023 NCWM Annual Conference. NIST OWM offers these comments and recommendations based upon information and input available as of the date

2023 OWM Annual Analysis

July 6, 2023
Author(s)
John McGuire, Lisa Warfield
The NIST OWM Analysis is submitted to assist the Weights and Measures community as it deliberates on items before the Conference. NIST OWM offers these comments and recommendations based upon information and input available as of the date of this report.

Operando photoelectron spectromicroscopy of nanodevices: Correlating the surface chemistry and transport in SnO2 nanowire chemiresistors

June 29, 2023
Author(s)
Andrei Kolmakov, Trey Diulus, Kurt D. Benkstein, Stephen Semancik, Majid Kazemian, Matteo Amati, Maya Kiskinova, Luca Gregoratti
With size reduction of active elements in microelectronics to tens of nanometers and below, the effect of surface and interface properties on overall device performance becomes crucial. High resolution spectroscopic and imaging techniques provide a
Displaying 26 - 50 of 2583