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Displaying 48001 - 48025 of 74066

Calculation of Spin-Dependent Interface Resistance

January 1, 2000

Author(s)

Mark D. Stiles, David R. Penn

A simple expression for the interface resistance between two materials has been derived by Schep et al. [J. Magn. Magn. Mater. 177, 1166 (1998).] in terms of the transmission probability for electrons at the interface. This approximation is tested for a

Calibration of Carrier Phase GPS Receivers

January 1, 2000

Author(s)

L M. Nelson, K M. Larson, Judah Levine

Calibration of High-Resolution X-Ray Tomography with Atomic Force Microscopy,

January 1, 2000

Author(s)

A R. Kalukin, B Winn, S S. Wang, C Jacobsen, Zachary H. Levine, Jing Fu

Calibration of Lightpipe Radiation Thermometers in a RTP Tool at 1000 Degrees Celsius

January 1, 2000

Author(s)

Vincent P. Scheuerman, K Kreider, C Meyer, D Dewitt

We are developing an instrumented calibration wafer for radiometric temperature measurements in rapid thermal processing (RTP) that uses Pt/Pd wire and noble metal thin-film thermocouples that are welded to thin-film pads of Pt. The Pt/Pd wire

Calibration of the National Institute of Standards and Technology Tritiated-Water Standards

January 1, 2000

Author(s)

Michael P. Unterweger, Larry L. Lucas

Cancellation of laser FM dither from optical frequency standards

January 1, 2000

Author(s)

J S. Taubman, John L. Hall

Carrier Concentration Dependence of Scanning Capacitance Microscopy Signal in the Vicinity of P-N Junctions

January 1, 2000

Author(s)

Joseph Kopanski, Jay F. Marchiando, Brian G. Rennex

Scanning capacitance microscopy was used to image 1) boron dopant gradients in p-type silicon, and 2) identical boron dopant gradients in n-type silicon. The bias voltage dependence of the apparent p-n junction location in the SCM images was measured. The

Carrier-envelope phase control of femtosecond mode-locked lasers and direct optical frequency synthesis

January 1, 2000

Author(s)

D J. Jones, Scott Diddams, A Stentz, R S. Windeler, John L. Hall, Steven T. Cundiff

Celebrating one hundred years of chemistry at the National Institute of Standards and Technology::Chemical Science and Technology Laboratory

January 1, 2000

Author(s)

Ellyn S Beary

Cellular Radiation Effects in Human Bronchial Epithelium Induced by Radon Progeny Alpha Particles

January 1, 2000

Author(s)

W Hofmann, M G. M{eacute}nache, D J. Crawford-brown, Randall S. Caswell, Lisa R. Karam

CEMHYD3D::a three-dimensional cement hydration and microstructure development modelling package. Version 2.0

January 1, 2000

Author(s)

Dale P Bentz

Ceramic coatings metrology workshop report:

January 1, 2000

Author(s)

S J Dapkunas

Ceramics Division - 1999 Technical Report

January 1, 2000

Author(s)

Stephen W. Freiman, S J. Dapkunas

Current programs of the Ceramics Division are reviewed

Ceramics, 1999 programs and accomplishments:

January 1, 2000

Author(s)

Stephen W Freiman, Stanley J Dapkunas

Certification of the relative molecular mass and intrinsic viscosity of SRM 2886, a polyethylene of narrow molecular mass distribution:

January 1, 2000

Author(s)

C M Guttman, J R Maruey, W R Blair

Certification of the relative molecular mass and the intrinsic viscosity of SRM 2885, a polyethylene:

January 1, 2000

Author(s)

C M Guttman, J R Maurey, W R Blair, C R Schultheisz

Certification of the relative molecular mass and the intrinsic viscosity of SRM 2887, a polyethylene of narrow molecular mass distribution:

January 1, 2000

Author(s)

C M Guttman, J R Maurey, W R Blair, C R Schultheisz

Certification of the Relative Molecular Mass and the Limiting Viscosity of SRM 2885, a Polyethylene of Narrow Molecular Mass Distribution

January 1, 2000

Author(s)

Charles M. Guttman, J R. Maurey, William R. Blair

The certification of a polyethylene standard reference material, SRM 2885, is described. The Mw of SRM 2885 by light scattering was determined to be 6.28 x 10 +3 g/mol with a sample standard deviation of 0.39 x 10 +3 g/mol. A combined expanded uncertainty

Certification of the Relative Molecular Mass and the Limiting Viscosity of SRM 2886, a Polyethylene of Narrow Molecular Mass Distribution

January 1, 2000

Author(s)

Charles M. Guttman, J R. Maurey, William R. Blair

Certification of the Relative Molecular Mass and the Limiting Viscosity of SRM 2887, a Polyethylene of Narrow Molecular Mass Distribution.

January 1, 2000

Author(s)

Charles M. Guttman, J R. Maurey, William R. Blair, Carl R. Schultesiz

Chaotic Resonance, Hopping Rates, Spectra and Signal-to-Noise Ratios

January 1, 2000

Author(s)

A Kovaleva, Emil Simiu

We consider a noise-free bistable system with a low frequency signal and a secondary harmonic excitation that causes the systemto experience chaotic motion with a broadband portion of the output spectrum. The signal-to-noise ratio (SNR) is defined on

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