U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 32151 - 32175 of 74061

Web Application Scanners: Definitions and Functions

January 3, 2007
Author(s)
Elizabeth N. Fong, Vadim Okun
There are many commercial software security assurance tools that claim to detect and prevent vulnerabilities in application software. However, a closer look at the tools often leaves one wondering which tools find what flaws? This paper identifies a

Manufacture and Metrology of 300 mm Silicon Wafers with Ultra-Low Thickness Variations

January 2, 2007
Author(s)
Ulf Griesmann, Quandou (. Wang, Marc Tricard, Paul Dumas, Christopher Hill
With the evolution of exposure tools for optical lithography towards larger numerical apertures, the semiconductor industry expects continued demand for improved wafer flatness at the exposure site. The Allowable site flatness for 300 mm wafers is expected

Standard Reference Materials Catalog - January 2007

January 2, 2007
Author(s)
Regina R. Montgomery, Joan C. Sauerwein
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100 individual reference materials produced and sold by NIST, each with carefully assigned values

3D Image Correction of Tilted Sample Through Coordinate Transformation

January 1, 2007
Author(s)
Wei Chu, Joseph Fu, Ronald G. Dixson, Theodore V. Vorburger
In scanned probe measurements of micrometer- or nanometer-scale lines, it is nearly impossible to maintain the sample in a perfectly level position, and even a small amount of tilt angle can contribute to the accuracy of the result of measurand such as

A Large Area Polarized 3He Neutron Spin Filter

January 1, 2007
Author(s)
T E. Chupp, K A. Coulterpark, M Kandes, Katelynn A. Sharma, T B. Smith, G Jones, W C. Chen, Thomas R. Gentile, D R. Rich, B Lauss, M T. Gericke, R C. Gillis, S A. Page, J D. Bowman, S I. Penttila, W S. Wilburn, M Dabaghyan, F W. Hersman, M Mason
Displaying 32151 - 32175 of 74061