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Displaying 50576 - 50600 of 74066

Polarization of Light Scattered by Particles on Silicon Wafers

January 1, 1999
Author(s)
Li Piin Sung, George W. Mulholland, Thomas Germer
Bidirectional ellipsometry has been developed as a technique for distinguishing among various scattering features near surfaces.Employi Employing incident light with fixed polarization, the technique measures the principal angle of polarization and the

Polymers 1998 Programs and Accomplishments

January 1, 1999
Author(s)
B M. Fanconi, Donald L. Hunston
Technical activities of the Polymers Division, 854, for the 1998 fiscal year are described. Thereport is organized by programs: Electronic Packaging, Interconnection and Assembly; Polymer Blends and Processing; Polymer Composites; Polymer Characterization

Post-Source Decay of Polystyrene Ions in Matrix-Assisted LaserDesorption/Ionization

January 1, 1999
Author(s)
R J. Goldschmidt, S Wetzel, William R. Blair, Charles M. Guttman
Analyte ions produced in matrix-assisted laser desorption/ionization (MALDI) are of low energy compared to those produced in many other mass spectrometricionization methods, so that there is usually little or no prompt fragmentation ofinitially formed ions

Precision Spectroscopy in He as a Test of QED

January 1, 1999
Author(s)
S D. Bergeson, A Balakrishnan, G H. Baldwin, Thomas B. Lucatorto, J P. Marangos, T J. McIlrath, Thomas R. O'Brian, S L. Rolston, Craig J. Sansonetti, J Wen, N Westbrook, C H. Cheng, E E. Eyler
Displaying 50576 - 50600 of 74066