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NIST Authors in Bold

Displaying 16701 - 16725 of 74040

Free Space Microwave Non Destructive Characterization of Composite Materials

May 4, 2015
Author(s)
Jan Obrzut, Ahmed M. Hassan, Edward J. Garboczi
We present a free-space microwave experimental measurement system for the non-destructive testing of composite materials. The system operates in the Q- frequency band of 30 GHz to 50 GHz with fixed wave propagation distance between free-space antennas

Thermal Analysis of Nanoparticles: Methods, Kinetics and Recent Advances

May 4, 2015
Author(s)
Elisabeth Mansfield
This chapter will provide an overview of the thermal techniques available to study nanoparticles, including thermogravimetric analysis, calorimetry and differential scanning calorimetry. The use of thermoanalysis for the measurement of nanoparticle purity

SHREC'15: Range Scans based 3D Shape Retrieval

May 3, 2015
Author(s)
Afzal A. Godil
The objective of the SHREC'15 Range Scans based 3D Shape Retrieval track is to evaluate algorithms that match range scans of real objects to complete 3D mesh models in a target dataset. The task is to retrieve a rank list of complete 3D models that are of

Bidirectional reflectance scale comparison between NIST and PTB

May 1, 2015
Author(s)
Catherine C. Cooksey, Maria E. Nadal, David W. Allen, Kai-Olaf Hauer, Andreas Hoepe
A comparison of bidirectional reflectance scales between the National Institute of Standards and Technology (NIST) and the Physikalisch-Technische Bundesanstalt (PTB) has been performed. Measurements of two sets of white diffuse reflectance standards, two

High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential

May 1, 2015
Author(s)
W.Bertrand (Randy) Doriese, Joseph Fowler, Daniel Swetz, Cherno Jaye, Daniel A. Fischer, Carl D. Reintsema, Douglas Bennett, Leila R. Vale, Gene C. Hilton, Dan Schmidt, Joel Ullom, Jens Uhlig, Ujjwal Mandal, Galen O'Neil, Luis Miaja Avila, Young I. Joe, wilfrid fullagar, Fredrick P. Gustafsson, Dharma Kurunthu, Villy Sundstrom
X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low

Introduction to the Special Issue

May 1, 2015
Author(s)
Thomas M. Wallis, Goutam Chattopadhyay, Fabio Cocetti, Luca Pierantoni
In the inaugural editorial of these IEEE Transactions on Terahertz Science and Technology – September 2011, the editor-in-chief anticipated that the work published in this journal would push beyond topics that are familiar to the traditional RF and
Displaying 16701 - 16725 of 74040