In this study, multilayered PbTixZr1-xO3 (PZT) samples (produced at sintering temperatures in the range of 1175 degrees C ¿ 1325 degrees C) were electrically fatigued by long-term exposure (~106 cycles) to electric fields and the parameters of initial and remnant polarization were estimated. Changes in the crystallographic microstructure as a function of sintering temperature Ts were examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) to gain insight on fatigue mechanisms and their prevention. Results showed that domain wall movement was facilitated in samples processed at lower Ts (less than 1250 degrees C), and that such samples were more resistant to electrical fatigue.
Proceedings Title: 2005 MRS Fall Meeting Proceedings
Conference Dates: November 28-December 2, 2005
Conference Location: Boston, MA
Conference Title: 2005 MRS Fall Meeting
Pub Type: Conferences
electrical fatigue, microstructure, PZT